Atomic Force Microscopy: A Powerful Tool for Electrical Characterization

Detalhes bibliográficos
Autor(a) principal: Tararam, Ronald [UNESP]
Data de Publicação: 2017
Outros Autores: Garcia, Pâmela S., Deda, Daiana K., Varela, José A. [UNESP], de Lima Leite, Fábio
Tipo de documento: Capítulo de livro
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3
http://hdl.handle.net/11449/232701
Resumo: The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM).
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spelling Atomic Force Microscopy: A Powerful Tool for Electrical CharacterizationAtomic force microscopyElectrostatic force microscopy (EFM)Intermittent contactNanocharacterizationSpatial resolutionTopographical imageThe fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM).Multidisciplinary Center for the Development of Ceramic Materials São Paulo State UniversityFederal University of São CarlosMultidisciplinary Center for the Development of Ceramic Materials São Paulo State UniversityUniversidade Estadual Paulista (UNESP)Universidade Federal de São Carlos (UFSCar)Tararam, Ronald [UNESP]Garcia, Pâmela S.Deda, Daiana K.Varela, José A. [UNESP]de Lima Leite, Fábio2022-04-30T05:15:59Z2022-04-30T05:15:59Z2017-03-23info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/bookPart37-64http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3Nanocharacterization Techniques, p. 37-64.http://hdl.handle.net/11449/23270110.1016/B978-0-323-49778-7.00002-32-s2.0-85040575407Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengNanocharacterization Techniquesinfo:eu-repo/semantics/openAccess2022-04-30T05:15:59Zoai:repositorio.unesp.br:11449/232701Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462022-04-30T05:15:59Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
title Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
spellingShingle Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
Tararam, Ronald [UNESP]
Atomic force microscopy
Electrostatic force microscopy (EFM)
Intermittent contact
Nanocharacterization
Spatial resolution
Topographical image
title_short Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
title_full Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
title_fullStr Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
title_full_unstemmed Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
title_sort Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
author Tararam, Ronald [UNESP]
author_facet Tararam, Ronald [UNESP]
Garcia, Pâmela S.
Deda, Daiana K.
Varela, José A. [UNESP]
de Lima Leite, Fábio
author_role author
author2 Garcia, Pâmela S.
Deda, Daiana K.
Varela, José A. [UNESP]
de Lima Leite, Fábio
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (UNESP)
Universidade Federal de São Carlos (UFSCar)
dc.contributor.author.fl_str_mv Tararam, Ronald [UNESP]
Garcia, Pâmela S.
Deda, Daiana K.
Varela, José A. [UNESP]
de Lima Leite, Fábio
dc.subject.por.fl_str_mv Atomic force microscopy
Electrostatic force microscopy (EFM)
Intermittent contact
Nanocharacterization
Spatial resolution
Topographical image
topic Atomic force microscopy
Electrostatic force microscopy (EFM)
Intermittent contact
Nanocharacterization
Spatial resolution
Topographical image
description The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM).
publishDate 2017
dc.date.none.fl_str_mv 2017-03-23
2022-04-30T05:15:59Z
2022-04-30T05:15:59Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/bookPart
format bookPart
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3
Nanocharacterization Techniques, p. 37-64.
http://hdl.handle.net/11449/232701
10.1016/B978-0-323-49778-7.00002-3
2-s2.0-85040575407
url http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3
http://hdl.handle.net/11449/232701
identifier_str_mv Nanocharacterization Techniques, p. 37-64.
10.1016/B978-0-323-49778-7.00002-3
2-s2.0-85040575407
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Nanocharacterization Techniques
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 37-64
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1803046815978749952

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