Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , , |
Tipo de documento: | Capítulo de livro |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3 http://hdl.handle.net/11449/232701 |
Resumo: | The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM). |
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Atomic Force Microscopy: A Powerful Tool for Electrical CharacterizationAtomic force microscopyElectrostatic force microscopy (EFM)Intermittent contactNanocharacterizationSpatial resolutionTopographical imageThe fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM).Multidisciplinary Center for the Development of Ceramic Materials São Paulo State UniversityFederal University of São CarlosMultidisciplinary Center for the Development of Ceramic Materials São Paulo State UniversityUniversidade Estadual Paulista (UNESP)Universidade Federal de São Carlos (UFSCar)Tararam, Ronald [UNESP]Garcia, Pâmela S.Deda, Daiana K.Varela, José A. [UNESP]de Lima Leite, Fábio2022-04-30T05:15:59Z2022-04-30T05:15:59Z2017-03-23info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/bookPart37-64http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3Nanocharacterization Techniques, p. 37-64.http://hdl.handle.net/11449/23270110.1016/B978-0-323-49778-7.00002-32-s2.0-85040575407Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengNanocharacterization Techniquesinfo:eu-repo/semantics/openAccess2022-04-30T05:15:59Zoai:repositorio.unesp.br:11449/232701Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T19:35:16.802677Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization |
title |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization |
spellingShingle |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization Tararam, Ronald [UNESP] Atomic force microscopy Electrostatic force microscopy (EFM) Intermittent contact Nanocharacterization Spatial resolution Topographical image |
title_short |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization |
title_full |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization |
title_fullStr |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization |
title_full_unstemmed |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization |
title_sort |
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization |
author |
Tararam, Ronald [UNESP] |
author_facet |
Tararam, Ronald [UNESP] Garcia, Pâmela S. Deda, Daiana K. Varela, José A. [UNESP] de Lima Leite, Fábio |
author_role |
author |
author2 |
Garcia, Pâmela S. Deda, Daiana K. Varela, José A. [UNESP] de Lima Leite, Fábio |
author2_role |
author author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (UNESP) Universidade Federal de São Carlos (UFSCar) |
dc.contributor.author.fl_str_mv |
Tararam, Ronald [UNESP] Garcia, Pâmela S. Deda, Daiana K. Varela, José A. [UNESP] de Lima Leite, Fábio |
dc.subject.por.fl_str_mv |
Atomic force microscopy Electrostatic force microscopy (EFM) Intermittent contact Nanocharacterization Spatial resolution Topographical image |
topic |
Atomic force microscopy Electrostatic force microscopy (EFM) Intermittent contact Nanocharacterization Spatial resolution Topographical image |
description |
The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM). |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-03-23 2022-04-30T05:15:59Z 2022-04-30T05:15:59Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/bookPart |
format |
bookPart |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3 Nanocharacterization Techniques, p. 37-64. http://hdl.handle.net/11449/232701 10.1016/B978-0-323-49778-7.00002-3 2-s2.0-85040575407 |
url |
http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3 http://hdl.handle.net/11449/232701 |
identifier_str_mv |
Nanocharacterization Techniques, p. 37-64. 10.1016/B978-0-323-49778-7.00002-3 2-s2.0-85040575407 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Nanocharacterization Techniques |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
37-64 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129090852487168 |