Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method

Detalhes bibliográficos
Autor(a) principal: Menezes de Oliveira, Andre Luiz
Data de Publicação: 2017
Outros Autores: Bouquet, Valerie, Dorcet, Vincent, Ivier, Sophie, Deputier, Stephanie, Souza, Antonio Gouveia de, Siu-Li, Maximo, Longo, Elson [UNESP], Weber, Ingrid Tavora, Garcia dos Santos, Ieda Maria, Guilloux-Viry, Maryline
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1016/j.surfcoat2017.01.082
http://hdl.handle.net/11449/165551
Resumo: SrSn1 (-) xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (theta-2 theta, omega-and -scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the [121] direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship (010)(film)//(010)substrate As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 (-) (x)TixO(3) solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. (C) 2017 Elsevier B.V. All rights reserved.
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spelling Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition methodThin filmsEpitaxial growthSurface/interface characteristicsChemical solution deposition (CSD)Pulsed laser deposition (PLD)PhotoluminescenceSrSn1 (-) xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (theta-2 theta, omega-and -scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the [121] direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship (010)(film)//(010)substrate As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 (-) (x)TixO(3) solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. (C) 2017 Elsevier B.V. All rights reserved.Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)European Union (CPER-FEDER)Univ Rennes 1, UMR CNRS 6226, Inst Sci Chim Rennes, Campus Beaulieu, F-35042 Rennes, FranceUniv Fed Paraiba, DQ, LACOM INCTMN, Campus 1, BR-58059900 Joao Pessoa, PB, BrazilUniv Sao Paulo, IFSC, BR-13560970 Sao Carlos, SP, BrazilUNESP, Inst Quim, LIEC CDMF, POB 355, BR-14801970 Araraquara, SP, BrazilUniv Brasilia, Inst Quim, LIMA, BR-70910900 Brasilia, DF, BrazilUNESP, Inst Quim, LIEC CDMF, POB 355, BR-14801970 Araraquara, SP, BrazilCAPES: 644/09Elsevier B.V.Univ Rennes 1Univ Fed ParaibaUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Universidade de Brasília (UnB)Menezes de Oliveira, Andre LuizBouquet, ValerieDorcet, VincentIvier, SophieDeputier, StephanieSouza, Antonio Gouveia deSiu-Li, MaximoLongo, Elson [UNESP]Weber, Ingrid TavoraGarcia dos Santos, Ieda MariaGuilloux-Viry, Maryline2018-11-28T07:23:19Z2018-11-28T07:23:19Z2017-03-15info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article361-373application/pdfhttp://dx.doi.org/10.1016/j.surfcoat2017.01.082Surface & Coatings Technology. Lausanne: Elsevier Science Sa, v. 313, p. 361-373, 2017.0257-8972http://hdl.handle.net/11449/16555110.1016/j.surfcoat2017.01.082WOS:000398873100044WOS000398873100044.pdfWeb of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengSurface & Coatings Technology0,928info:eu-repo/semantics/openAccess2023-11-10T06:14:51Zoai:repositorio.unesp.br:11449/165551Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462023-11-10T06:14:51Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
spellingShingle Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
Menezes de Oliveira, Andre Luiz
Thin films
Epitaxial growth
Surface/interface characteristics
Chemical solution deposition (CSD)
Pulsed laser deposition (PLD)
Photoluminescence
title_short Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_full Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_fullStr Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_full_unstemmed Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_sort Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
author Menezes de Oliveira, Andre Luiz
author_facet Menezes de Oliveira, Andre Luiz
Bouquet, Valerie
Dorcet, Vincent
Ivier, Sophie
Deputier, Stephanie
Souza, Antonio Gouveia de
Siu-Li, Maximo
Longo, Elson [UNESP]
Weber, Ingrid Tavora
Garcia dos Santos, Ieda Maria
Guilloux-Viry, Maryline
author_role author
author2 Bouquet, Valerie
Dorcet, Vincent
Ivier, Sophie
Deputier, Stephanie
Souza, Antonio Gouveia de
Siu-Li, Maximo
Longo, Elson [UNESP]
Weber, Ingrid Tavora
Garcia dos Santos, Ieda Maria
Guilloux-Viry, Maryline
author2_role author
author
author
author
author
author
author
author
author
author
dc.contributor.none.fl_str_mv Univ Rennes 1
Univ Fed Paraiba
Universidade de São Paulo (USP)
Universidade Estadual Paulista (Unesp)
Universidade de Brasília (UnB)
dc.contributor.author.fl_str_mv Menezes de Oliveira, Andre Luiz
Bouquet, Valerie
Dorcet, Vincent
Ivier, Sophie
Deputier, Stephanie
Souza, Antonio Gouveia de
Siu-Li, Maximo
Longo, Elson [UNESP]
Weber, Ingrid Tavora
Garcia dos Santos, Ieda Maria
Guilloux-Viry, Maryline
dc.subject.por.fl_str_mv Thin films
Epitaxial growth
Surface/interface characteristics
Chemical solution deposition (CSD)
Pulsed laser deposition (PLD)
Photoluminescence
topic Thin films
Epitaxial growth
Surface/interface characteristics
Chemical solution deposition (CSD)
Pulsed laser deposition (PLD)
Photoluminescence
description SrSn1 (-) xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (theta-2 theta, omega-and -scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the [121] direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship (010)(film)//(010)substrate As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 (-) (x)TixO(3) solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. (C) 2017 Elsevier B.V. All rights reserved.
publishDate 2017
dc.date.none.fl_str_mv 2017-03-15
2018-11-28T07:23:19Z
2018-11-28T07:23:19Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1016/j.surfcoat2017.01.082
Surface & Coatings Technology. Lausanne: Elsevier Science Sa, v. 313, p. 361-373, 2017.
0257-8972
http://hdl.handle.net/11449/165551
10.1016/j.surfcoat2017.01.082
WOS:000398873100044
WOS000398873100044.pdf
url http://dx.doi.org/10.1016/j.surfcoat2017.01.082
http://hdl.handle.net/11449/165551
identifier_str_mv Surface & Coatings Technology. Lausanne: Elsevier Science Sa, v. 313, p. 361-373, 2017.
0257-8972
10.1016/j.surfcoat2017.01.082
WOS:000398873100044
WOS000398873100044.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Surface & Coatings Technology
0,928
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 361-373
application/pdf
dc.publisher.none.fl_str_mv Elsevier B.V.
publisher.none.fl_str_mv Elsevier B.V.
dc.source.none.fl_str_mv Web of Science
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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