Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method

Detalhes bibliográficos
Autor(a) principal: Menezes de Oliveira, André Luiz
Data de Publicação: 2017
Outros Autores: Bouquet, Valérie, Dorcet, Vincent, Ollivier, Sophie, Députier, Stéphanie, Gouveia de Souza, Antônio, Siu-Li, Maximo, Longo, Elson [UNESP], Távora Weber, Ingrid, Garcia dos Santos, Iêda Maria, Guilloux-Viry, Maryline
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1016/j.surfcoat.2017.01.082
http://hdl.handle.net/11449/178638
Resumo: SrSn1 − xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (θ–2θ, ω- and φ-scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the 121¯ direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship ⟨010⟩film // ⟨010⟩substrate. As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 − xTixO3 solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated.
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spelling Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition methodChemical solution deposition (CSD)Epitaxial growthPhotoluminescencePulsed laser deposition (PLD)Surface/interface characteristicsThin filmsSrSn1 − xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (θ–2θ, ω- and φ-scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the 121¯ direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship ⟨010⟩film // ⟨010⟩substrate. As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 − xTixO3 solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated.Institut des Sciences Chimiques de Rennes UMR 6226 CNRS/Université de Rennes 1, Campus de BeaulieuLACOM/INCTMN DQ Universidade Federal de Paraiba, Campus IIFSC Universidade de São PauloLIEC/CDMF Instituto de Química UNESP, P.O. Box 355LIMA Instituto de Química Universidade de BrasíliaLIEC/CDMF Instituto de Química UNESP, P.O. Box 355UMR 6226 CNRS/Université de Rennes 1Universidade Federal de ParaibaUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Universidade de Brasília (UnB)Menezes de Oliveira, André LuizBouquet, ValérieDorcet, VincentOllivier, SophieDéputier, StéphanieGouveia de Souza, AntônioSiu-Li, MaximoLongo, Elson [UNESP]Távora Weber, IngridGarcia dos Santos, Iêda MariaGuilloux-Viry, Maryline2018-12-11T17:31:26Z2018-12-11T17:31:26Z2017-03-15info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article361-373application/pdfhttp://dx.doi.org/10.1016/j.surfcoat.2017.01.082Surface and Coatings Technology, v. 313, p. 361-373.0257-8972http://hdl.handle.net/11449/17863810.1016/j.surfcoat.2017.01.0822-s2.0-850121541702-s2.0-85012154170.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengSurface and Coatings Technology0,928info:eu-repo/semantics/openAccess2024-01-28T06:44:36Zoai:repositorio.unesp.br:11449/178638Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-01-28T06:44:36Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
spellingShingle Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
Menezes de Oliveira, André Luiz
Chemical solution deposition (CSD)
Epitaxial growth
Photoluminescence
Pulsed laser deposition (PLD)
Surface/interface characteristics
Thin films
title_short Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_full Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_fullStr Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_full_unstemmed Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
title_sort Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
author Menezes de Oliveira, André Luiz
author_facet Menezes de Oliveira, André Luiz
Bouquet, Valérie
Dorcet, Vincent
Ollivier, Sophie
Députier, Stéphanie
Gouveia de Souza, Antônio
Siu-Li, Maximo
Longo, Elson [UNESP]
Távora Weber, Ingrid
Garcia dos Santos, Iêda Maria
Guilloux-Viry, Maryline
author_role author
author2 Bouquet, Valérie
Dorcet, Vincent
Ollivier, Sophie
Députier, Stéphanie
Gouveia de Souza, Antônio
Siu-Li, Maximo
Longo, Elson [UNESP]
Távora Weber, Ingrid
Garcia dos Santos, Iêda Maria
Guilloux-Viry, Maryline
author2_role author
author
author
author
author
author
author
author
author
author
dc.contributor.none.fl_str_mv UMR 6226 CNRS/Université de Rennes 1
Universidade Federal de Paraiba
Universidade de São Paulo (USP)
Universidade Estadual Paulista (Unesp)
Universidade de Brasília (UnB)
dc.contributor.author.fl_str_mv Menezes de Oliveira, André Luiz
Bouquet, Valérie
Dorcet, Vincent
Ollivier, Sophie
Députier, Stéphanie
Gouveia de Souza, Antônio
Siu-Li, Maximo
Longo, Elson [UNESP]
Távora Weber, Ingrid
Garcia dos Santos, Iêda Maria
Guilloux-Viry, Maryline
dc.subject.por.fl_str_mv Chemical solution deposition (CSD)
Epitaxial growth
Photoluminescence
Pulsed laser deposition (PLD)
Surface/interface characteristics
Thin films
topic Chemical solution deposition (CSD)
Epitaxial growth
Photoluminescence
Pulsed laser deposition (PLD)
Surface/interface characteristics
Thin films
description SrSn1 − xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (θ–2θ, ω- and φ-scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the 121¯ direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship ⟨010⟩film // ⟨010⟩substrate. As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 − xTixO3 solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated.
publishDate 2017
dc.date.none.fl_str_mv 2017-03-15
2018-12-11T17:31:26Z
2018-12-11T17:31:26Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1016/j.surfcoat.2017.01.082
Surface and Coatings Technology, v. 313, p. 361-373.
0257-8972
http://hdl.handle.net/11449/178638
10.1016/j.surfcoat.2017.01.082
2-s2.0-85012154170
2-s2.0-85012154170.pdf
url http://dx.doi.org/10.1016/j.surfcoat.2017.01.082
http://hdl.handle.net/11449/178638
identifier_str_mv Surface and Coatings Technology, v. 313, p. 361-373.
0257-8972
10.1016/j.surfcoat.2017.01.082
2-s2.0-85012154170
2-s2.0-85012154170.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Surface and Coatings Technology
0,928
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 361-373
application/pdf
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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