Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1016/j.surfcoat2017.01.082 http://hdl.handle.net/11449/165551 |
Resumo: | SrSn1 (-) xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (theta-2 theta, omega-and -scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the [121] direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship (010)(film)//(010)substrate As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 (-) (x)TixO(3) solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. (C) 2017 Elsevier B.V. All rights reserved. |
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Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition methodThin filmsEpitaxial growthSurface/interface characteristicsChemical solution deposition (CSD)Pulsed laser deposition (PLD)PhotoluminescenceSrSn1 (-) xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (theta-2 theta, omega-and -scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the [121] direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship (010)(film)//(010)substrate As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 (-) (x)TixO(3) solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. (C) 2017 Elsevier B.V. All rights reserved.Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)European Union (CPER-FEDER)Univ Rennes 1, UMR CNRS 6226, Inst Sci Chim Rennes, Campus Beaulieu, F-35042 Rennes, FranceUniv Fed Paraiba, DQ, LACOM INCTMN, Campus 1, BR-58059900 Joao Pessoa, PB, BrazilUniv Sao Paulo, IFSC, BR-13560970 Sao Carlos, SP, BrazilUNESP, Inst Quim, LIEC CDMF, POB 355, BR-14801970 Araraquara, SP, BrazilUniv Brasilia, Inst Quim, LIMA, BR-70910900 Brasilia, DF, BrazilUNESP, Inst Quim, LIEC CDMF, POB 355, BR-14801970 Araraquara, SP, BrazilCAPES: 644/09Elsevier B.V.Univ Rennes 1Univ Fed ParaibaUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Universidade de Brasília (UnB)Menezes de Oliveira, Andre LuizBouquet, ValerieDorcet, VincentIvier, SophieDeputier, StephanieSouza, Antonio Gouveia deSiu-Li, MaximoLongo, Elson [UNESP]Weber, Ingrid TavoraGarcia dos Santos, Ieda MariaGuilloux-Viry, Maryline2018-11-28T07:23:19Z2018-11-28T07:23:19Z2017-03-15info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article361-373application/pdfhttp://dx.doi.org/10.1016/j.surfcoat2017.01.082Surface & Coatings Technology. Lausanne: Elsevier Science Sa, v. 313, p. 361-373, 2017.0257-8972http://hdl.handle.net/11449/16555110.1016/j.surfcoat2017.01.082WOS:000398873100044WOS000398873100044.pdfWeb of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengSurface & Coatings Technology0,928info:eu-repo/semantics/openAccess2023-11-10T06:14:51Zoai:repositorio.unesp.br:11449/165551Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462023-11-10T06:14:51Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
spellingShingle |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method Menezes de Oliveira, Andre Luiz Thin films Epitaxial growth Surface/interface characteristics Chemical solution deposition (CSD) Pulsed laser deposition (PLD) Photoluminescence |
title_short |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_full |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_fullStr |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_full_unstemmed |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_sort |
Evolution of the structural and microstructural characteristics of SrSn1 - xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
author |
Menezes de Oliveira, Andre Luiz |
author_facet |
Menezes de Oliveira, Andre Luiz Bouquet, Valerie Dorcet, Vincent Ivier, Sophie Deputier, Stephanie Souza, Antonio Gouveia de Siu-Li, Maximo Longo, Elson [UNESP] Weber, Ingrid Tavora Garcia dos Santos, Ieda Maria Guilloux-Viry, Maryline |
author_role |
author |
author2 |
Bouquet, Valerie Dorcet, Vincent Ivier, Sophie Deputier, Stephanie Souza, Antonio Gouveia de Siu-Li, Maximo Longo, Elson [UNESP] Weber, Ingrid Tavora Garcia dos Santos, Ieda Maria Guilloux-Viry, Maryline |
author2_role |
author author author author author author author author author author |
dc.contributor.none.fl_str_mv |
Univ Rennes 1 Univ Fed Paraiba Universidade de São Paulo (USP) Universidade Estadual Paulista (Unesp) Universidade de Brasília (UnB) |
dc.contributor.author.fl_str_mv |
Menezes de Oliveira, Andre Luiz Bouquet, Valerie Dorcet, Vincent Ivier, Sophie Deputier, Stephanie Souza, Antonio Gouveia de Siu-Li, Maximo Longo, Elson [UNESP] Weber, Ingrid Tavora Garcia dos Santos, Ieda Maria Guilloux-Viry, Maryline |
dc.subject.por.fl_str_mv |
Thin films Epitaxial growth Surface/interface characteristics Chemical solution deposition (CSD) Pulsed laser deposition (PLD) Photoluminescence |
topic |
Thin films Epitaxial growth Surface/interface characteristics Chemical solution deposition (CSD) Pulsed laser deposition (PLD) Photoluminescence |
description |
SrSn1 (-) xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (theta-2 theta, omega-and -scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the [121] direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship (010)(film)//(010)substrate As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 (-) (x)TixO(3) solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. (C) 2017 Elsevier B.V. All rights reserved. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-03-15 2018-11-28T07:23:19Z 2018-11-28T07:23:19Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1016/j.surfcoat2017.01.082 Surface & Coatings Technology. Lausanne: Elsevier Science Sa, v. 313, p. 361-373, 2017. 0257-8972 http://hdl.handle.net/11449/165551 10.1016/j.surfcoat2017.01.082 WOS:000398873100044 WOS000398873100044.pdf |
url |
http://dx.doi.org/10.1016/j.surfcoat2017.01.082 http://hdl.handle.net/11449/165551 |
identifier_str_mv |
Surface & Coatings Technology. Lausanne: Elsevier Science Sa, v. 313, p. 361-373, 2017. 0257-8972 10.1016/j.surfcoat2017.01.082 WOS:000398873100044 WOS000398873100044.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Surface & Coatings Technology 0,928 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
361-373 application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier B.V. |
publisher.none.fl_str_mv |
Elsevier B.V. |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1803649674280697856 |