Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1016/j.surfcoat.2017.01.082 http://hdl.handle.net/11449/178638 |
Resumo: | SrSn1 − xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (θ–2θ, ω- and φ-scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the 121¯ direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship ⟨010⟩film // ⟨010⟩substrate. As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 − xTixO3 solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. |
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Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition methodChemical solution deposition (CSD)Epitaxial growthPhotoluminescencePulsed laser deposition (PLD)Surface/interface characteristicsThin filmsSrSn1 − xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (θ–2θ, ω- and φ-scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the 121¯ direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship ⟨010⟩film // ⟨010⟩substrate. As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 − xTixO3 solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated.Institut des Sciences Chimiques de Rennes UMR 6226 CNRS/Université de Rennes 1, Campus de BeaulieuLACOM/INCTMN DQ Universidade Federal de Paraiba, Campus IIFSC Universidade de São PauloLIEC/CDMF Instituto de Química UNESP, P.O. Box 355LIMA Instituto de Química Universidade de BrasíliaLIEC/CDMF Instituto de Química UNESP, P.O. Box 355UMR 6226 CNRS/Université de Rennes 1Universidade Federal de ParaibaUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Universidade de Brasília (UnB)Menezes de Oliveira, André LuizBouquet, ValérieDorcet, VincentOllivier, SophieDéputier, StéphanieGouveia de Souza, AntônioSiu-Li, MaximoLongo, Elson [UNESP]Távora Weber, IngridGarcia dos Santos, Iêda MariaGuilloux-Viry, Maryline2018-12-11T17:31:26Z2018-12-11T17:31:26Z2017-03-15info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article361-373application/pdfhttp://dx.doi.org/10.1016/j.surfcoat.2017.01.082Surface and Coatings Technology, v. 313, p. 361-373.0257-8972http://hdl.handle.net/11449/17863810.1016/j.surfcoat.2017.01.0822-s2.0-850121541702-s2.0-85012154170.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengSurface and Coatings Technology0,928info:eu-repo/semantics/openAccess2024-01-28T06:44:36Zoai:repositorio.unesp.br:11449/178638Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-01-28T06:44:36Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
spellingShingle |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method Menezes de Oliveira, André Luiz Chemical solution deposition (CSD) Epitaxial growth Photoluminescence Pulsed laser deposition (PLD) Surface/interface characteristics Thin films |
title_short |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_full |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_fullStr |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_full_unstemmed |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
title_sort |
Evolution of the structural and microstructural characteristics of SrSn1 − xTixO3 thin films under the influence of the composition, the substrate and the deposition method |
author |
Menezes de Oliveira, André Luiz |
author_facet |
Menezes de Oliveira, André Luiz Bouquet, Valérie Dorcet, Vincent Ollivier, Sophie Députier, Stéphanie Gouveia de Souza, Antônio Siu-Li, Maximo Longo, Elson [UNESP] Távora Weber, Ingrid Garcia dos Santos, Iêda Maria Guilloux-Viry, Maryline |
author_role |
author |
author2 |
Bouquet, Valérie Dorcet, Vincent Ollivier, Sophie Députier, Stéphanie Gouveia de Souza, Antônio Siu-Li, Maximo Longo, Elson [UNESP] Távora Weber, Ingrid Garcia dos Santos, Iêda Maria Guilloux-Viry, Maryline |
author2_role |
author author author author author author author author author author |
dc.contributor.none.fl_str_mv |
UMR 6226 CNRS/Université de Rennes 1 Universidade Federal de Paraiba Universidade de São Paulo (USP) Universidade Estadual Paulista (Unesp) Universidade de Brasília (UnB) |
dc.contributor.author.fl_str_mv |
Menezes de Oliveira, André Luiz Bouquet, Valérie Dorcet, Vincent Ollivier, Sophie Députier, Stéphanie Gouveia de Souza, Antônio Siu-Li, Maximo Longo, Elson [UNESP] Távora Weber, Ingrid Garcia dos Santos, Iêda Maria Guilloux-Viry, Maryline |
dc.subject.por.fl_str_mv |
Chemical solution deposition (CSD) Epitaxial growth Photoluminescence Pulsed laser deposition (PLD) Surface/interface characteristics Thin films |
topic |
Chemical solution deposition (CSD) Epitaxial growth Photoluminescence Pulsed laser deposition (PLD) Surface/interface characteristics Thin films |
description |
SrSn1 − xTixO3 thin films were grown on R-sapphire and (100) LaAlO3 single crystal substrates by two different routes: chemical solution deposition (CSD) and pulsed laser deposition (PLD). Structural and microstructural characteristics of the films were determined by X-ray diffraction (θ–2θ, ω- and φ-scans) and field emission scanning electron microscopy. Pure perovskite phase was obtained for all of the compositions, whatever the method of deposition and the substrate nature. On R-sapphire, a randomly oriented growth (polycrystalline) was observed for all of the compositions deposited by CSD while (h00) preferential orientation was attained when deposition was done by PLD, in particular for SrTiO3 composition. The phi-scan performed on this sample revealed that the (100) oriented grains present an in-plane ordering (epitaxial growth) with respect to the substrate with an alignment of the [011] direction of the film along the 121¯ direction of the substrate, explained on the basis of misfit considerations and interface arrangements. All of the films grown on (100) LaAlO3 exhibited an epitaxial growth with an in-plane relationship ⟨010⟩film // ⟨010⟩substrate. As for the thin film microstructure, porosity, homogeneity, shape and size of the grains were strongly influenced by Ti content in the SrSn1 − xTixO3 solid solution, and also by the nature of the substrate and by the deposition method. Moreover, the influence of the composition and thin film growth on the photoluminescence of SST films were also evaluated. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-03-15 2018-12-11T17:31:26Z 2018-12-11T17:31:26Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1016/j.surfcoat.2017.01.082 Surface and Coatings Technology, v. 313, p. 361-373. 0257-8972 http://hdl.handle.net/11449/178638 10.1016/j.surfcoat.2017.01.082 2-s2.0-85012154170 2-s2.0-85012154170.pdf |
url |
http://dx.doi.org/10.1016/j.surfcoat.2017.01.082 http://hdl.handle.net/11449/178638 |
identifier_str_mv |
Surface and Coatings Technology, v. 313, p. 361-373. 0257-8972 10.1016/j.surfcoat.2017.01.082 2-s2.0-85012154170 2-s2.0-85012154170.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Surface and Coatings Technology 0,928 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
361-373 application/pdf |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1803650372540039168 |