Modelling of the influence of the layer pollution thickness in high voltage polluted insulators
Autor(a) principal: | |
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Data de Publicação: | 1995 |
Outros Autores: | |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1109/ICSD.1995.523038 http://hdl.handle.net/11449/64674 |
Resumo: | An experimental model and a mathematical model with the introduction of a ramp in the channel of Obenaus model are presented. The aim is to present a better reproduction of the real layer pollution deposited on the HV insulators. This better reproduction is obtained from two types of thickness variation: the introduction of a ramp (soft variation) and the introduction of a step (sudden variation). The computational simulations and the experimental data suggest that the introduction of the ramp is the better reproduction of the layer pollution. The ramp approximates to the real layer pollution more than the step. |
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Repositório Institucional da UNESP |
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spelling |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulatorsAlgorithmsApproximation theoryComputational methodsComputer simulationElectric dischargesElectric resistanceFlashoverGeometryMathematical modelsPollutionHigh voltage polluted insulatorsObenaus modelVoltage polarityElectric insulating materialsAn experimental model and a mathematical model with the introduction of a ramp in the channel of Obenaus model are presented. The aim is to present a better reproduction of the real layer pollution deposited on the HV insulators. This better reproduction is obtained from two types of thickness variation: the introduction of a ramp (soft variation) and the introduction of a step (sudden variation). The computational simulations and the experimental data suggest that the introduction of the ramp is the better reproduction of the layer pollution. The ramp approximates to the real layer pollution more than the step.FEIS/UNESP, Sao PauloFEIS/UNESP, Sao PauloUniversidade Estadual Paulista (Unesp)do Prado, A. J. [UNESP]Astorga, O. A M [UNESP]2014-05-27T11:18:02Z2014-05-27T11:18:02Z1995-12-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject508-512http://dx.doi.org/10.1109/ICSD.1995.523038IEEE International Conference on Conduction & Breakdown in Solid Dielectrics, p. 508-512.http://hdl.handle.net/11449/6467410.1109/ICSD.1995.523038WOS:A1995BD97L000992-s2.0-0029483857Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengIEEE International Conference on Conduction & Breakdown in Solid Dielectricsinfo:eu-repo/semantics/openAccess2021-10-23T21:37:50Zoai:repositorio.unesp.br:11449/64674Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T14:31:02.475317Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators |
title |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators |
spellingShingle |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators do Prado, A. J. [UNESP] Algorithms Approximation theory Computational methods Computer simulation Electric discharges Electric resistance Flashover Geometry Mathematical models Pollution High voltage polluted insulators Obenaus model Voltage polarity Electric insulating materials |
title_short |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators |
title_full |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators |
title_fullStr |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators |
title_full_unstemmed |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators |
title_sort |
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators |
author |
do Prado, A. J. [UNESP] |
author_facet |
do Prado, A. J. [UNESP] Astorga, O. A M [UNESP] |
author_role |
author |
author2 |
Astorga, O. A M [UNESP] |
author2_role |
author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
do Prado, A. J. [UNESP] Astorga, O. A M [UNESP] |
dc.subject.por.fl_str_mv |
Algorithms Approximation theory Computational methods Computer simulation Electric discharges Electric resistance Flashover Geometry Mathematical models Pollution High voltage polluted insulators Obenaus model Voltage polarity Electric insulating materials |
topic |
Algorithms Approximation theory Computational methods Computer simulation Electric discharges Electric resistance Flashover Geometry Mathematical models Pollution High voltage polluted insulators Obenaus model Voltage polarity Electric insulating materials |
description |
An experimental model and a mathematical model with the introduction of a ramp in the channel of Obenaus model are presented. The aim is to present a better reproduction of the real layer pollution deposited on the HV insulators. This better reproduction is obtained from two types of thickness variation: the introduction of a ramp (soft variation) and the introduction of a step (sudden variation). The computational simulations and the experimental data suggest that the introduction of the ramp is the better reproduction of the layer pollution. The ramp approximates to the real layer pollution more than the step. |
publishDate |
1995 |
dc.date.none.fl_str_mv |
1995-12-01 2014-05-27T11:18:02Z 2014-05-27T11:18:02Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1109/ICSD.1995.523038 IEEE International Conference on Conduction & Breakdown in Solid Dielectrics, p. 508-512. http://hdl.handle.net/11449/64674 10.1109/ICSD.1995.523038 WOS:A1995BD97L00099 2-s2.0-0029483857 |
url |
http://dx.doi.org/10.1109/ICSD.1995.523038 http://hdl.handle.net/11449/64674 |
identifier_str_mv |
IEEE International Conference on Conduction & Breakdown in Solid Dielectrics, p. 508-512. 10.1109/ICSD.1995.523038 WOS:A1995BD97L00099 2-s2.0-0029483857 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
IEEE International Conference on Conduction & Breakdown in Solid Dielectrics |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
508-512 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808128371895304192 |