Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators

Detalhes bibliográficos
Autor(a) principal: Astorga, Oscar Armando Maldonado [UNESP]
Data de Publicação: 1994
Outros Autores: do Prado, Afonso Jose [UNESP]
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1109/ELINSL.1994.401397
http://hdl.handle.net/11449/130721
Resumo: Results of the analysis of dynamic behavior of flashover phenomenon on the high voltage-polluted insulators are presented. These results were taken from a mathematical and an experimental model that introduce the variable thickness influence of the layer pollution deposited on the high-voltage insulator surface. Analysis of the flashover was done by way of introducing a variation in the thickness of the channel of Obenaus' model, simulating a layer pollution of variable thickness. The objective was to obtain a better reproduction of the real layer pollution deposited on the insulator that works in the polluted regions. Two types of thickness variations were used: a sudden variation, using a step; and a soft variation, using a ramp; that were put along the way of the discharge. Comparison between the mathematical and experimental models showed that introduction of a ramp makes Obenaus' model more efficient in analyzing behavior of flashover phenomenon.
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spelling Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulatorsAlgorithmsComputer simulationElectric dischargesEquivalent circuitsGeometryMathematical modelsFlashover phenomenonHigh voltage polluted insulatorsObenaus modelRampStepVoltage polarityElectric insulatorsResults of the analysis of dynamic behavior of flashover phenomenon on the high voltage-polluted insulators are presented. These results were taken from a mathematical and an experimental model that introduce the variable thickness influence of the layer pollution deposited on the high-voltage insulator surface. Analysis of the flashover was done by way of introducing a variation in the thickness of the channel of Obenaus' model, simulating a layer pollution of variable thickness. The objective was to obtain a better reproduction of the real layer pollution deposited on the insulator that works in the polluted regions. Two types of thickness variations were used: a sudden variation, using a step; and a soft variation, using a ramp; that were put along the way of the discharge. Comparison between the mathematical and experimental models showed that introduction of a ramp makes Obenaus' model more efficient in analyzing behavior of flashover phenomenon.UNESP,FEIS,DEPT ENGN ELETR,BR-15378000 ILHA SOLTEIRA,SP,BRAZILUNESP,FEIS,DEPT ENGN ELETR,BR-15378000 ILHA SOLTEIRA,SP,BRAZILInstitute of Electrical and Electronics Engineers (IEEE)Universidade Estadual Paulista (Unesp)Astorga, Oscar Armando Maldonado [UNESP]do Prado, Afonso Jose [UNESP]2014-05-27T11:17:58Z2014-05-27T11:17:58Z1994-12-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject546-549http://dx.doi.org/10.1109/ELINSL.1994.401397Conference Record of IEEE International Symposium on Electrical Insulation, p. 546-549.0164-2006http://hdl.handle.net/11449/13072110.1109/ELINSL.1994.401397WOS:A1994BA96P001322-s2.0-0028564615Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengConference Record of IEEE International Symposium on Electrical Insulationinfo:eu-repo/semantics/openAccess2021-10-23T21:41:29Zoai:repositorio.unesp.br:11449/130721Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462021-10-23T21:41:29Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
title Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
spellingShingle Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
Astorga, Oscar Armando Maldonado [UNESP]
Algorithms
Computer simulation
Electric discharges
Equivalent circuits
Geometry
Mathematical models
Flashover phenomenon
High voltage polluted insulators
Obenaus model
Ramp
Step
Voltage polarity
Electric insulators
title_short Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
title_full Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
title_fullStr Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
title_full_unstemmed Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
title_sort Flashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulators
author Astorga, Oscar Armando Maldonado [UNESP]
author_facet Astorga, Oscar Armando Maldonado [UNESP]
do Prado, Afonso Jose [UNESP]
author_role author
author2 do Prado, Afonso Jose [UNESP]
author2_role author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Astorga, Oscar Armando Maldonado [UNESP]
do Prado, Afonso Jose [UNESP]
dc.subject.por.fl_str_mv Algorithms
Computer simulation
Electric discharges
Equivalent circuits
Geometry
Mathematical models
Flashover phenomenon
High voltage polluted insulators
Obenaus model
Ramp
Step
Voltage polarity
Electric insulators
topic Algorithms
Computer simulation
Electric discharges
Equivalent circuits
Geometry
Mathematical models
Flashover phenomenon
High voltage polluted insulators
Obenaus model
Ramp
Step
Voltage polarity
Electric insulators
description Results of the analysis of dynamic behavior of flashover phenomenon on the high voltage-polluted insulators are presented. These results were taken from a mathematical and an experimental model that introduce the variable thickness influence of the layer pollution deposited on the high-voltage insulator surface. Analysis of the flashover was done by way of introducing a variation in the thickness of the channel of Obenaus' model, simulating a layer pollution of variable thickness. The objective was to obtain a better reproduction of the real layer pollution deposited on the insulator that works in the polluted regions. Two types of thickness variations were used: a sudden variation, using a step; and a soft variation, using a ramp; that were put along the way of the discharge. Comparison between the mathematical and experimental models showed that introduction of a ramp makes Obenaus' model more efficient in analyzing behavior of flashover phenomenon.
publishDate 1994
dc.date.none.fl_str_mv 1994-12-01
2014-05-27T11:17:58Z
2014-05-27T11:17:58Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1109/ELINSL.1994.401397
Conference Record of IEEE International Symposium on Electrical Insulation, p. 546-549.
0164-2006
http://hdl.handle.net/11449/130721
10.1109/ELINSL.1994.401397
WOS:A1994BA96P00132
2-s2.0-0028564615
url http://dx.doi.org/10.1109/ELINSL.1994.401397
http://hdl.handle.net/11449/130721
identifier_str_mv Conference Record of IEEE International Symposium on Electrical Insulation, p. 546-549.
0164-2006
10.1109/ELINSL.1994.401397
WOS:A1994BA96P00132
2-s2.0-0028564615
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Conference Record of IEEE International Symposium on Electrical Insulation
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 546-549
dc.publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers (IEEE)
publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers (IEEE)
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1803649528596791296

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