Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence
Autor(a) principal: | |
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Data de Publicação: | 2021 |
Outros Autores: | , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1109/LAEDC51812.2021.9437909 http://hdl.handle.net/11449/245244 |
Resumo: | This paper presents a simple analytical modelling of a Electronically Tunable Potentiometer (ETP) circuit, made of a pseudo-resistor pair and a feedback mechanism that keeps resistance invariant to common mode voltage. The modelling utilizes the first order quadratic equations for the MOS transistor. In order to validate the analytical model, a Verilog-A model was written using the same MOS equations, and later matched to the ibm 130nm technology node resulting in a satisfactory approximation, with relative errors within 15%. Analysis of the ETP control voltage, pseudo-resistor current and pseudo-resistor resistance using the simple model were performed as a function of body factor. When the body factor decreases (better gate to channel electrostatic coupling) the pseudo-resistance increases for the same silicon chip area. |
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Repositório Institucional da UNESP |
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Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor InfluenceAnalytical ModelETPBody factorTechnological NodesThis paper presents a simple analytical modelling of a Electronically Tunable Potentiometer (ETP) circuit, made of a pseudo-resistor pair and a feedback mechanism that keeps resistance invariant to common mode voltage. The modelling utilizes the first order quadratic equations for the MOS transistor. In order to validate the analytical model, a Verilog-A model was written using the same MOS equations, and later matched to the ibm 130nm technology node resulting in a satisfactory approximation, with relative errors within 15%. Analysis of the ETP control voltage, pseudo-resistor current and pseudo-resistor resistance using the simple model were performed as a function of body factor. When the body factor decreases (better gate to channel electrostatic coupling) the pseudo-resistance increases for the same silicon chip area.Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoa de Nível Superior (CAPES)Univ Sao Paulo, LSI PSI USP, Sao Paulo, BrazilSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, BrazilSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, BrazilIeeeUniversidade de São Paulo (USP)Universidade Estadual Paulista (UNESP)Sousa, Julia C. S.Martino, Joao A.Agopian, Paula G. D. [UNESP]IEEE2023-07-29T11:49:22Z2023-07-29T11:49:22Z2021-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject4http://dx.doi.org/10.1109/LAEDC51812.2021.94379092021 IEEE Latin America Electron Devices Conference (laedc). New York: IEEE, 4 p., 2021.http://hdl.handle.net/11449/24524410.1109/LAEDC51812.2021.9437909WOS:000948082600003Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2021 Ieee Latin America Electron Devices Conference (laedc)info:eu-repo/semantics/openAccess2023-07-29T11:49:22Zoai:repositorio.unesp.br:11449/245244Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T22:54:14.800370Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence |
title |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence |
spellingShingle |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence Sousa, Julia C. S. Analytical Model ETP Body factor Technological Nodes |
title_short |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence |
title_full |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence |
title_fullStr |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence |
title_full_unstemmed |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence |
title_sort |
Simple Analytical Modelling of an Electronically Tunable Potentiometer and Body Factor Influence |
author |
Sousa, Julia C. S. |
author_facet |
Sousa, Julia C. S. Martino, Joao A. Agopian, Paula G. D. [UNESP] IEEE |
author_role |
author |
author2 |
Martino, Joao A. Agopian, Paula G. D. [UNESP] IEEE |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
Universidade de São Paulo (USP) Universidade Estadual Paulista (UNESP) |
dc.contributor.author.fl_str_mv |
Sousa, Julia C. S. Martino, Joao A. Agopian, Paula G. D. [UNESP] IEEE |
dc.subject.por.fl_str_mv |
Analytical Model ETP Body factor Technological Nodes |
topic |
Analytical Model ETP Body factor Technological Nodes |
description |
This paper presents a simple analytical modelling of a Electronically Tunable Potentiometer (ETP) circuit, made of a pseudo-resistor pair and a feedback mechanism that keeps resistance invariant to common mode voltage. The modelling utilizes the first order quadratic equations for the MOS transistor. In order to validate the analytical model, a Verilog-A model was written using the same MOS equations, and later matched to the ibm 130nm technology node resulting in a satisfactory approximation, with relative errors within 15%. Analysis of the ETP control voltage, pseudo-resistor current and pseudo-resistor resistance using the simple model were performed as a function of body factor. When the body factor decreases (better gate to channel electrostatic coupling) the pseudo-resistance increases for the same silicon chip area. |
publishDate |
2021 |
dc.date.none.fl_str_mv |
2021-01-01 2023-07-29T11:49:22Z 2023-07-29T11:49:22Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1109/LAEDC51812.2021.9437909 2021 IEEE Latin America Electron Devices Conference (laedc). New York: IEEE, 4 p., 2021. http://hdl.handle.net/11449/245244 10.1109/LAEDC51812.2021.9437909 WOS:000948082600003 |
url |
http://dx.doi.org/10.1109/LAEDC51812.2021.9437909 http://hdl.handle.net/11449/245244 |
identifier_str_mv |
2021 IEEE Latin America Electron Devices Conference (laedc). New York: IEEE, 4 p., 2021. 10.1109/LAEDC51812.2021.9437909 WOS:000948082600003 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
2021 Ieee Latin America Electron Devices Conference (laedc) |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
4 |
dc.publisher.none.fl_str_mv |
Ieee |
publisher.none.fl_str_mv |
Ieee |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129472347504640 |