Impact of defects on the electrical properties of BiFeO3 thin films

Detalhes bibliográficos
Autor(a) principal: Reis, S. P. [UNESP]
Data de Publicação: 2020
Outros Autores: Araujo, E. B. [UNESP]
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1080/00150193.2020.1713344
http://hdl.handle.net/11449/196782
Resumo: The impact of defects on the electrical properties of bismuth ferrite thin films has been studied. Secondary phases and oxygen vacancies were the main defects considered. Thin films with secondary phases show higher conductivities than single-phase films. Monophasic films annealed in oxygen atmosphere shows lower conductivity than the non-annealed film. For selected thin film with secondary phase, the relaxation in the grain boundary was predominant with activation energy eV, suggesting the first ionization oxygen vacancies as the relaxation mechanism in the studied films. The electric field effect on relaxation processes was similarly to Arrhenius thermally activated process.
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spelling Impact of defects on the electrical properties of BiFeO3 thin filmsDefectsbismuth ferritethin filmsThe impact of defects on the electrical properties of bismuth ferrite thin films has been studied. Secondary phases and oxygen vacancies were the main defects considered. Thin films with secondary phases show higher conductivities than single-phase films. Monophasic films annealed in oxygen atmosphere shows lower conductivity than the non-annealed film. For selected thin film with secondary phase, the relaxation in the grain boundary was predominant with activation energy eV, suggesting the first ionization oxygen vacancies as the relaxation mechanism in the studied films. The electric field effect on relaxation processes was similarly to Arrhenius thermally activated process.Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Sao Paulo State Univ, Dept Phys & Chem, Ilha Solteira, BrazilFed Inst Educ Sci & Technol Sao Paulo, Votuporanga, BrazilSao Paulo State Univ, Dept Phys & Chem, Ilha Solteira, BrazilFAPESP: 2017/13769-1CNPq: 304604/2015-1Taylor & Francis LtdUniversidade Estadual Paulista (Unesp)Fed Inst Educ Sci & Technol Sao PauloReis, S. P. [UNESP]Araujo, E. B. [UNESP]2020-12-10T19:56:02Z2020-12-10T19:56:02Z2020-02-17info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article70-78http://dx.doi.org/10.1080/00150193.2020.1713344Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 556, n. 1, p. 70-78, 2020.0015-0193http://hdl.handle.net/11449/19678210.1080/00150193.2020.1713344WOS:000526426500011Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengFerroelectricsinfo:eu-repo/semantics/openAccess2021-10-23T10:02:15Zoai:repositorio.unesp.br:11449/196782Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462021-10-23T10:02:15Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Impact of defects on the electrical properties of BiFeO3 thin films
title Impact of defects on the electrical properties of BiFeO3 thin films
spellingShingle Impact of defects on the electrical properties of BiFeO3 thin films
Reis, S. P. [UNESP]
Defects
bismuth ferrite
thin films
title_short Impact of defects on the electrical properties of BiFeO3 thin films
title_full Impact of defects on the electrical properties of BiFeO3 thin films
title_fullStr Impact of defects on the electrical properties of BiFeO3 thin films
title_full_unstemmed Impact of defects on the electrical properties of BiFeO3 thin films
title_sort Impact of defects on the electrical properties of BiFeO3 thin films
author Reis, S. P. [UNESP]
author_facet Reis, S. P. [UNESP]
Araujo, E. B. [UNESP]
author_role author
author2 Araujo, E. B. [UNESP]
author2_role author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
Fed Inst Educ Sci & Technol Sao Paulo
dc.contributor.author.fl_str_mv Reis, S. P. [UNESP]
Araujo, E. B. [UNESP]
dc.subject.por.fl_str_mv Defects
bismuth ferrite
thin films
topic Defects
bismuth ferrite
thin films
description The impact of defects on the electrical properties of bismuth ferrite thin films has been studied. Secondary phases and oxygen vacancies were the main defects considered. Thin films with secondary phases show higher conductivities than single-phase films. Monophasic films annealed in oxygen atmosphere shows lower conductivity than the non-annealed film. For selected thin film with secondary phase, the relaxation in the grain boundary was predominant with activation energy eV, suggesting the first ionization oxygen vacancies as the relaxation mechanism in the studied films. The electric field effect on relaxation processes was similarly to Arrhenius thermally activated process.
publishDate 2020
dc.date.none.fl_str_mv 2020-12-10T19:56:02Z
2020-12-10T19:56:02Z
2020-02-17
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1080/00150193.2020.1713344
Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 556, n. 1, p. 70-78, 2020.
0015-0193
http://hdl.handle.net/11449/196782
10.1080/00150193.2020.1713344
WOS:000526426500011
url http://dx.doi.org/10.1080/00150193.2020.1713344
http://hdl.handle.net/11449/196782
identifier_str_mv Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 556, n. 1, p. 70-78, 2020.
0015-0193
10.1080/00150193.2020.1713344
WOS:000526426500011
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Ferroelectrics
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 70-78
dc.publisher.none.fl_str_mv Taylor & Francis Ltd
publisher.none.fl_str_mv Taylor & Francis Ltd
dc.source.none.fl_str_mv Web of Science
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1799965524676837376

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