Impact of defects on the electrical properties of BiFeO3 thin films
Autor(a) principal: | |
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Data de Publicação: | 2020 |
Outros Autores: | |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1080/00150193.2020.1713344 http://hdl.handle.net/11449/196782 |
Resumo: | The impact of defects on the electrical properties of bismuth ferrite thin films has been studied. Secondary phases and oxygen vacancies were the main defects considered. Thin films with secondary phases show higher conductivities than single-phase films. Monophasic films annealed in oxygen atmosphere shows lower conductivity than the non-annealed film. For selected thin film with secondary phase, the relaxation in the grain boundary was predominant with activation energy eV, suggesting the first ionization oxygen vacancies as the relaxation mechanism in the studied films. The electric field effect on relaxation processes was similarly to Arrhenius thermally activated process. |
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Repositório Institucional da UNESP |
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Impact of defects on the electrical properties of BiFeO3 thin filmsDefectsbismuth ferritethin filmsThe impact of defects on the electrical properties of bismuth ferrite thin films has been studied. Secondary phases and oxygen vacancies were the main defects considered. Thin films with secondary phases show higher conductivities than single-phase films. Monophasic films annealed in oxygen atmosphere shows lower conductivity than the non-annealed film. For selected thin film with secondary phase, the relaxation in the grain boundary was predominant with activation energy eV, suggesting the first ionization oxygen vacancies as the relaxation mechanism in the studied films. The electric field effect on relaxation processes was similarly to Arrhenius thermally activated process.Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Sao Paulo State Univ, Dept Phys & Chem, Ilha Solteira, BrazilFed Inst Educ Sci & Technol Sao Paulo, Votuporanga, BrazilSao Paulo State Univ, Dept Phys & Chem, Ilha Solteira, BrazilFAPESP: 2017/13769-1CNPq: 304604/2015-1Taylor & Francis LtdUniversidade Estadual Paulista (Unesp)Fed Inst Educ Sci & Technol Sao PauloReis, S. P. [UNESP]Araujo, E. B. [UNESP]2020-12-10T19:56:02Z2020-12-10T19:56:02Z2020-02-17info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article70-78http://dx.doi.org/10.1080/00150193.2020.1713344Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 556, n. 1, p. 70-78, 2020.0015-0193http://hdl.handle.net/11449/19678210.1080/00150193.2020.1713344WOS:000526426500011Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengFerroelectricsinfo:eu-repo/semantics/openAccess2024-07-10T14:07:59Zoai:repositorio.unesp.br:11449/196782Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T22:11:03.243399Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Impact of defects on the electrical properties of BiFeO3 thin films |
title |
Impact of defects on the electrical properties of BiFeO3 thin films |
spellingShingle |
Impact of defects on the electrical properties of BiFeO3 thin films Reis, S. P. [UNESP] Defects bismuth ferrite thin films |
title_short |
Impact of defects on the electrical properties of BiFeO3 thin films |
title_full |
Impact of defects on the electrical properties of BiFeO3 thin films |
title_fullStr |
Impact of defects on the electrical properties of BiFeO3 thin films |
title_full_unstemmed |
Impact of defects on the electrical properties of BiFeO3 thin films |
title_sort |
Impact of defects on the electrical properties of BiFeO3 thin films |
author |
Reis, S. P. [UNESP] |
author_facet |
Reis, S. P. [UNESP] Araujo, E. B. [UNESP] |
author_role |
author |
author2 |
Araujo, E. B. [UNESP] |
author2_role |
author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) Fed Inst Educ Sci & Technol Sao Paulo |
dc.contributor.author.fl_str_mv |
Reis, S. P. [UNESP] Araujo, E. B. [UNESP] |
dc.subject.por.fl_str_mv |
Defects bismuth ferrite thin films |
topic |
Defects bismuth ferrite thin films |
description |
The impact of defects on the electrical properties of bismuth ferrite thin films has been studied. Secondary phases and oxygen vacancies were the main defects considered. Thin films with secondary phases show higher conductivities than single-phase films. Monophasic films annealed in oxygen atmosphere shows lower conductivity than the non-annealed film. For selected thin film with secondary phase, the relaxation in the grain boundary was predominant with activation energy eV, suggesting the first ionization oxygen vacancies as the relaxation mechanism in the studied films. The electric field effect on relaxation processes was similarly to Arrhenius thermally activated process. |
publishDate |
2020 |
dc.date.none.fl_str_mv |
2020-12-10T19:56:02Z 2020-12-10T19:56:02Z 2020-02-17 |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1080/00150193.2020.1713344 Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 556, n. 1, p. 70-78, 2020. 0015-0193 http://hdl.handle.net/11449/196782 10.1080/00150193.2020.1713344 WOS:000526426500011 |
url |
http://dx.doi.org/10.1080/00150193.2020.1713344 http://hdl.handle.net/11449/196782 |
identifier_str_mv |
Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 556, n. 1, p. 70-78, 2020. 0015-0193 10.1080/00150193.2020.1713344 WOS:000526426500011 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Ferroelectrics |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
70-78 |
dc.publisher.none.fl_str_mv |
Taylor & Francis Ltd |
publisher.none.fl_str_mv |
Taylor & Francis Ltd |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129401458524160 |