Rebound effect on Charged Based Bio-TFETs for different biomolecules

Detalhes bibliográficos
Autor(a) principal: Macambira, C. N.
Data de Publicação: 2019
Outros Autores: Agopian, P. G. D. [UNESP], Martino, J. A., IEEE
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://hdl.handle.net/11449/195644
Resumo: In this work, the charged biomolecules with different permittivity (epsilon) localized on the drain underlap region of a double gate (DG) N-type tunneling field effect transistor (nTFET) for biosensing purpose (Bio-TFET) is presented. The fixed charges are localized at the interface between the biomaterial and the silicon channel. The main studied parameter of the charged Bio-TFET is the sensitivity. In the charge range studied, the results show that the device presents higher sensitivity for lower dielectric constant biomolecules (e.g., thiol linkers and biotin) and it was also observed a rebound effect on the drain current (and sensitivity) for high concentration ( > 1x10(12) cm(-2)) of positive fixed charges. This rebound effect is caused by the shift of the electric field peak from the drain/channel to the gate/biomaterial regions.
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spelling Rebound effect on Charged Based Bio-TFETs for different biomoleculesTFETBiosensorBio-TFETPermittivityChargeSensitivityReboundIn this work, the charged biomolecules with different permittivity (epsilon) localized on the drain underlap region of a double gate (DG) N-type tunneling field effect transistor (nTFET) for biosensing purpose (Bio-TFET) is presented. The fixed charges are localized at the interface between the biomaterial and the silicon channel. The main studied parameter of the charged Bio-TFET is the sensitivity. In the charge range studied, the results show that the device presents higher sensitivity for lower dielectric constant biomolecules (e.g., thiol linkers and biotin) and it was also observed a rebound effect on the drain current (and sensitivity) for high concentration ( > 1x10(12) cm(-2)) of positive fixed charges. This rebound effect is caused by the shift of the electric field peak from the drain/channel to the gate/biomaterial regions.Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Univ Sao Paulo, USP, PSI, LSI, Sao Paulo, BrazilSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, BrazilSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, BrazilIeeeUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Macambira, C. N.Agopian, P. G. D. [UNESP]Martino, J. A.IEEE2020-12-10T17:58:55Z2020-12-10T17:58:55Z2019-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject32019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, 3 p., 2019.2330-5738http://hdl.handle.net/11449/195644WOS:000565067300006Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis)info:eu-repo/semantics/openAccess2021-10-23T10:18:16Zoai:repositorio.unesp.br:11449/195644Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T17:58:46.895326Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Rebound effect on Charged Based Bio-TFETs for different biomolecules
title Rebound effect on Charged Based Bio-TFETs for different biomolecules
spellingShingle Rebound effect on Charged Based Bio-TFETs for different biomolecules
Macambira, C. N.
TFET
Biosensor
Bio-TFET
Permittivity
Charge
Sensitivity
Rebound
title_short Rebound effect on Charged Based Bio-TFETs for different biomolecules
title_full Rebound effect on Charged Based Bio-TFETs for different biomolecules
title_fullStr Rebound effect on Charged Based Bio-TFETs for different biomolecules
title_full_unstemmed Rebound effect on Charged Based Bio-TFETs for different biomolecules
title_sort Rebound effect on Charged Based Bio-TFETs for different biomolecules
author Macambira, C. N.
author_facet Macambira, C. N.
Agopian, P. G. D. [UNESP]
Martino, J. A.
IEEE
author_role author
author2 Agopian, P. G. D. [UNESP]
Martino, J. A.
IEEE
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidade de São Paulo (USP)
Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Macambira, C. N.
Agopian, P. G. D. [UNESP]
Martino, J. A.
IEEE
dc.subject.por.fl_str_mv TFET
Biosensor
Bio-TFET
Permittivity
Charge
Sensitivity
Rebound
topic TFET
Biosensor
Bio-TFET
Permittivity
Charge
Sensitivity
Rebound
description In this work, the charged biomolecules with different permittivity (epsilon) localized on the drain underlap region of a double gate (DG) N-type tunneling field effect transistor (nTFET) for biosensing purpose (Bio-TFET) is presented. The fixed charges are localized at the interface between the biomaterial and the silicon channel. The main studied parameter of the charged Bio-TFET is the sensitivity. In the charge range studied, the results show that the device presents higher sensitivity for lower dielectric constant biomolecules (e.g., thiol linkers and biotin) and it was also observed a rebound effect on the drain current (and sensitivity) for high concentration ( > 1x10(12) cm(-2)) of positive fixed charges. This rebound effect is caused by the shift of the electric field peak from the drain/channel to the gate/biomaterial regions.
publishDate 2019
dc.date.none.fl_str_mv 2019-01-01
2020-12-10T17:58:55Z
2020-12-10T17:58:55Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv 2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, 3 p., 2019.
2330-5738
http://hdl.handle.net/11449/195644
WOS:000565067300006
identifier_str_mv 2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, 3 p., 2019.
2330-5738
WOS:000565067300006
url http://hdl.handle.net/11449/195644
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis)
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 3
dc.publisher.none.fl_str_mv Ieee
publisher.none.fl_str_mv Ieee
dc.source.none.fl_str_mv Web of Science
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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