Rebound effect on Charged Based Bio-TFETs for different biomolecules
Autor(a) principal: | |
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Data de Publicação: | 2019 |
Outros Autores: | , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://hdl.handle.net/11449/195644 |
Resumo: | In this work, the charged biomolecules with different permittivity (epsilon) localized on the drain underlap region of a double gate (DG) N-type tunneling field effect transistor (nTFET) for biosensing purpose (Bio-TFET) is presented. The fixed charges are localized at the interface between the biomaterial and the silicon channel. The main studied parameter of the charged Bio-TFET is the sensitivity. In the charge range studied, the results show that the device presents higher sensitivity for lower dielectric constant biomolecules (e.g., thiol linkers and biotin) and it was also observed a rebound effect on the drain current (and sensitivity) for high concentration ( > 1x10(12) cm(-2)) of positive fixed charges. This rebound effect is caused by the shift of the electric field peak from the drain/channel to the gate/biomaterial regions. |
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Repositório Institucional da UNESP |
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Rebound effect on Charged Based Bio-TFETs for different biomoleculesTFETBiosensorBio-TFETPermittivityChargeSensitivityReboundIn this work, the charged biomolecules with different permittivity (epsilon) localized on the drain underlap region of a double gate (DG) N-type tunneling field effect transistor (nTFET) for biosensing purpose (Bio-TFET) is presented. The fixed charges are localized at the interface between the biomaterial and the silicon channel. The main studied parameter of the charged Bio-TFET is the sensitivity. In the charge range studied, the results show that the device presents higher sensitivity for lower dielectric constant biomolecules (e.g., thiol linkers and biotin) and it was also observed a rebound effect on the drain current (and sensitivity) for high concentration ( > 1x10(12) cm(-2)) of positive fixed charges. This rebound effect is caused by the shift of the electric field peak from the drain/channel to the gate/biomaterial regions.Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Univ Sao Paulo, USP, PSI, LSI, Sao Paulo, BrazilSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, BrazilSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, BrazilIeeeUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Macambira, C. N.Agopian, P. G. D. [UNESP]Martino, J. A.IEEE2020-12-10T17:58:55Z2020-12-10T17:58:55Z2019-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject32019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, 3 p., 2019.2330-5738http://hdl.handle.net/11449/195644WOS:000565067300006Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis)info:eu-repo/semantics/openAccess2021-10-23T10:18:16Zoai:repositorio.unesp.br:11449/195644Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T17:58:46.895326Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Rebound effect on Charged Based Bio-TFETs for different biomolecules |
title |
Rebound effect on Charged Based Bio-TFETs for different biomolecules |
spellingShingle |
Rebound effect on Charged Based Bio-TFETs for different biomolecules Macambira, C. N. TFET Biosensor Bio-TFET Permittivity Charge Sensitivity Rebound |
title_short |
Rebound effect on Charged Based Bio-TFETs for different biomolecules |
title_full |
Rebound effect on Charged Based Bio-TFETs for different biomolecules |
title_fullStr |
Rebound effect on Charged Based Bio-TFETs for different biomolecules |
title_full_unstemmed |
Rebound effect on Charged Based Bio-TFETs for different biomolecules |
title_sort |
Rebound effect on Charged Based Bio-TFETs for different biomolecules |
author |
Macambira, C. N. |
author_facet |
Macambira, C. N. Agopian, P. G. D. [UNESP] Martino, J. A. IEEE |
author_role |
author |
author2 |
Agopian, P. G. D. [UNESP] Martino, J. A. IEEE |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
Universidade de São Paulo (USP) Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Macambira, C. N. Agopian, P. G. D. [UNESP] Martino, J. A. IEEE |
dc.subject.por.fl_str_mv |
TFET Biosensor Bio-TFET Permittivity Charge Sensitivity Rebound |
topic |
TFET Biosensor Bio-TFET Permittivity Charge Sensitivity Rebound |
description |
In this work, the charged biomolecules with different permittivity (epsilon) localized on the drain underlap region of a double gate (DG) N-type tunneling field effect transistor (nTFET) for biosensing purpose (Bio-TFET) is presented. The fixed charges are localized at the interface between the biomaterial and the silicon channel. The main studied parameter of the charged Bio-TFET is the sensitivity. In the charge range studied, the results show that the device presents higher sensitivity for lower dielectric constant biomolecules (e.g., thiol linkers and biotin) and it was also observed a rebound effect on the drain current (and sensitivity) for high concentration ( > 1x10(12) cm(-2)) of positive fixed charges. This rebound effect is caused by the shift of the electric field peak from the drain/channel to the gate/biomaterial regions. |
publishDate |
2019 |
dc.date.none.fl_str_mv |
2019-01-01 2020-12-10T17:58:55Z 2020-12-10T17:58:55Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, 3 p., 2019. 2330-5738 http://hdl.handle.net/11449/195644 WOS:000565067300006 |
identifier_str_mv |
2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, 3 p., 2019. 2330-5738 WOS:000565067300006 |
url |
http://hdl.handle.net/11449/195644 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis) |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
3 |
dc.publisher.none.fl_str_mv |
Ieee |
publisher.none.fl_str_mv |
Ieee |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808128881457102848 |