Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)

Detalhes bibliográficos
Autor(a) principal: De Souza, Flávio Queiroz [UNESP]
Data de Publicação: 2011
Outros Autores: Oki, Nobuo [UNESP]
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1145/2020876.2020889
http://hdl.handle.net/11449/72757
Resumo: In this paper, the susceptibility of a current-mode bandgap voltage reference to electromagnetic interference (EMI) superimposed to the power supply is investigated by simulation. Designed for AMS 0.35 CMOS process, the circuit provides a stable voltage reference in the temperature range of -40-150°C. When EMI disturbances are present, the circuit exhibits only 6.7 mV of offset for interfering signals in the frequency range of 150 kHz-1 GHz. © 2011 ACM.
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spelling Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)bandgapcurrent-mode voltage reference.electromagnetic interferenceemisusceptibilityvoltage reference0.35 CMOSBandgap voltage referenceCurrent modeFrequency rangesInterfering signalsPower supplyTemperature rangeCMOS integrated circuitsElectromagnetic pulseElectromagnetic wave interferenceElectromagnetismEnergy gapIntegrated circuitsSignal interferenceSystems analysisVoltage measurementIn this paper, the susceptibility of a current-mode bandgap voltage reference to electromagnetic interference (EMI) superimposed to the power supply is investigated by simulation. Designed for AMS 0.35 CMOS process, the circuit provides a stable voltage reference in the temperature range of -40-150°C. When EMI disturbances are present, the circuit exhibits only 6.7 mV of offset for interfering signals in the frequency range of 150 kHz-1 GHz. © 2011 ACM.Departamento de Engenharia Elétrica Faculdade de Engenharia de Ilha Solteira-FEIS Universidade Estadual Paulista - UNESP, Avenida Brasil, 56, Centro - Ilha Solteira - SPDepartamento de Engenharia Elétrica Faculdade de Engenharia de Ilha Solteira-FEIS Universidade Estadual Paulista - UNESP, Avenida Brasil, 56, Centro - Ilha Solteira - SPUniversidade Estadual Paulista (Unesp)De Souza, Flávio Queiroz [UNESP]Oki, Nobuo [UNESP]2014-05-27T11:26:06Z2014-05-27T11:26:06Z2011-10-25info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject51-54http://dx.doi.org/10.1145/2020876.2020889Proceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design, p. 51-54.http://hdl.handle.net/11449/7275710.1145/2020876.20208892-s2.0-800547857101525717947689076Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengProceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Designinfo:eu-repo/semantics/openAccess2024-07-04T19:11:50Zoai:repositorio.unesp.br:11449/72757Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T21:47:25.663589Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
title Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
spellingShingle Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
De Souza, Flávio Queiroz [UNESP]
bandgap
current-mode voltage reference.
electromagnetic interference
emi
susceptibility
voltage reference
0.35 CMOS
Bandgap voltage reference
Current mode
Frequency ranges
Interfering signals
Power supply
Temperature range
CMOS integrated circuits
Electromagnetic pulse
Electromagnetic wave interference
Electromagnetism
Energy gap
Integrated circuits
Signal interference
Systems analysis
Voltage measurement
title_short Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
title_full Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
title_fullStr Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
title_full_unstemmed Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
title_sort Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)
author De Souza, Flávio Queiroz [UNESP]
author_facet De Souza, Flávio Queiroz [UNESP]
Oki, Nobuo [UNESP]
author_role author
author2 Oki, Nobuo [UNESP]
author2_role author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv De Souza, Flávio Queiroz [UNESP]
Oki, Nobuo [UNESP]
dc.subject.por.fl_str_mv bandgap
current-mode voltage reference.
electromagnetic interference
emi
susceptibility
voltage reference
0.35 CMOS
Bandgap voltage reference
Current mode
Frequency ranges
Interfering signals
Power supply
Temperature range
CMOS integrated circuits
Electromagnetic pulse
Electromagnetic wave interference
Electromagnetism
Energy gap
Integrated circuits
Signal interference
Systems analysis
Voltage measurement
topic bandgap
current-mode voltage reference.
electromagnetic interference
emi
susceptibility
voltage reference
0.35 CMOS
Bandgap voltage reference
Current mode
Frequency ranges
Interfering signals
Power supply
Temperature range
CMOS integrated circuits
Electromagnetic pulse
Electromagnetic wave interference
Electromagnetism
Energy gap
Integrated circuits
Signal interference
Systems analysis
Voltage measurement
description In this paper, the susceptibility of a current-mode bandgap voltage reference to electromagnetic interference (EMI) superimposed to the power supply is investigated by simulation. Designed for AMS 0.35 CMOS process, the circuit provides a stable voltage reference in the temperature range of -40-150°C. When EMI disturbances are present, the circuit exhibits only 6.7 mV of offset for interfering signals in the frequency range of 150 kHz-1 GHz. © 2011 ACM.
publishDate 2011
dc.date.none.fl_str_mv 2011-10-25
2014-05-27T11:26:06Z
2014-05-27T11:26:06Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1145/2020876.2020889
Proceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design, p. 51-54.
http://hdl.handle.net/11449/72757
10.1145/2020876.2020889
2-s2.0-80054785710
1525717947689076
url http://dx.doi.org/10.1145/2020876.2020889
http://hdl.handle.net/11449/72757
identifier_str_mv Proceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design, p. 51-54.
10.1145/2020876.2020889
2-s2.0-80054785710
1525717947689076
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Proceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 51-54
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1808129358397702144

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