Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene

Detalhes bibliográficos
Autor(a) principal: Boratto, Miguel H. [UNESP]
Data de Publicação: 2018
Outros Autores: Scalvi, Luis V. A. [UNESP], Goncharova, Lyudmila V., Fanchini, Giovanni
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1007/s10854-018-0131-9
http://hdl.handle.net/11449/186952
Resumo: In this article, the effect of phenyl-C61-butyric acid methyl ester (PCBM) layer on the electrical performance of field-effect transistors (FETs) based on antimony-doped tin dioxide (Sb:SnO2) is reported. PCBM is a soluble variety of fullerene, n-type organic semiconductor, known to promote the p-type doping of semiconducting materials such as diamond and graphene, via charge transfer. Sb:SnO2 is an emerging low-cost transparent oxide semiconductor material that exhibits strong unipolar behavior (n-type). Ambipolar character in tin dioxide normally is not observed, however in this study we find that the deposition of PCBM on top of Sb:SnO2 promotes ambipolar behavior in Sb:SnO2 FETs. At negative gate bias (VG < 0) PCBM traps free electrons from the conduction band of SnO2 and from Sb donors, thus downshifting the Sb:SnO2 Fermi level (EF), leading to a strong injection of holes in the valence band of Sb:SnO2. The p-type carrier concentration increases up to 8.6 × 1011 cm−2. Our results suggest that PCBM deposition decreases the current in the accumulation mode of electrons due to electron mobility decrease at VG > 0, and enhances the current in inversion mode. Besides, PCBM deposition also results in an increase of hole mobility at VG < 0.
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spelling Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullereneIn this article, the effect of phenyl-C61-butyric acid methyl ester (PCBM) layer on the electrical performance of field-effect transistors (FETs) based on antimony-doped tin dioxide (Sb:SnO2) is reported. PCBM is a soluble variety of fullerene, n-type organic semiconductor, known to promote the p-type doping of semiconducting materials such as diamond and graphene, via charge transfer. Sb:SnO2 is an emerging low-cost transparent oxide semiconductor material that exhibits strong unipolar behavior (n-type). Ambipolar character in tin dioxide normally is not observed, however in this study we find that the deposition of PCBM on top of Sb:SnO2 promotes ambipolar behavior in Sb:SnO2 FETs. At negative gate bias (VG < 0) PCBM traps free electrons from the conduction band of SnO2 and from Sb donors, thus downshifting the Sb:SnO2 Fermi level (EF), leading to a strong injection of holes in the valence band of Sb:SnO2. The p-type carrier concentration increases up to 8.6 × 1011 cm−2. Our results suggest that PCBM deposition decreases the current in the accumulation mode of electrons due to electron mobility decrease at VG > 0, and enhances the current in inversion mode. Besides, PCBM deposition also results in an increase of hole mobility at VG < 0.Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of CanadaDepartment of Physics Post-Graduate Program in Physics Federal University of Santa Catarina (UFSC)Department of Physics School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology São Paulo State University (UNESP)Department of Physics and Astronomy University of Western OntarioCentre of Advanced Materials and Biomaterials Research (CAMBR) University of Western OntarioDepartment of Chemistry University of Western OntarioDepartment of Physics School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology São Paulo State University (UNESP)CNPq: 471359/2013-0Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada: RGPIN-2015-06004Universidade Federal de Santa Catarina (UFSC)Universidade Estadual Paulista (Unesp)University of Western OntarioBoratto, Miguel H. [UNESP]Scalvi, Luis V. A. [UNESP]Goncharova, Lyudmila V.Fanchini, Giovanni2019-10-06T15:20:53Z2019-10-06T15:20:53Z2018-12-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article20010-20016http://dx.doi.org/10.1007/s10854-018-0131-9Journal of Materials Science: Materials in Electronics, v. 29, n. 23, p. 20010-20016, 2018.1573-482X0957-4522http://hdl.handle.net/11449/18695210.1007/s10854-018-0131-92-s2.0-85054807144Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengJournal of Materials Science: Materials in Electronicsinfo:eu-repo/semantics/openAccess2021-10-23T05:33:24Zoai:repositorio.unesp.br:11449/186952Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462021-10-23T05:33:24Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
title Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
spellingShingle Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
Boratto, Miguel H. [UNESP]
title_short Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
title_full Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
title_fullStr Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
title_full_unstemmed Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
title_sort Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
author Boratto, Miguel H. [UNESP]
author_facet Boratto, Miguel H. [UNESP]
Scalvi, Luis V. A. [UNESP]
Goncharova, Lyudmila V.
Fanchini, Giovanni
author_role author
author2 Scalvi, Luis V. A. [UNESP]
Goncharova, Lyudmila V.
Fanchini, Giovanni
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidade Federal de Santa Catarina (UFSC)
Universidade Estadual Paulista (Unesp)
University of Western Ontario
dc.contributor.author.fl_str_mv Boratto, Miguel H. [UNESP]
Scalvi, Luis V. A. [UNESP]
Goncharova, Lyudmila V.
Fanchini, Giovanni
description In this article, the effect of phenyl-C61-butyric acid methyl ester (PCBM) layer on the electrical performance of field-effect transistors (FETs) based on antimony-doped tin dioxide (Sb:SnO2) is reported. PCBM is a soluble variety of fullerene, n-type organic semiconductor, known to promote the p-type doping of semiconducting materials such as diamond and graphene, via charge transfer. Sb:SnO2 is an emerging low-cost transparent oxide semiconductor material that exhibits strong unipolar behavior (n-type). Ambipolar character in tin dioxide normally is not observed, however in this study we find that the deposition of PCBM on top of Sb:SnO2 promotes ambipolar behavior in Sb:SnO2 FETs. At negative gate bias (VG < 0) PCBM traps free electrons from the conduction band of SnO2 and from Sb donors, thus downshifting the Sb:SnO2 Fermi level (EF), leading to a strong injection of holes in the valence band of Sb:SnO2. The p-type carrier concentration increases up to 8.6 × 1011 cm−2. Our results suggest that PCBM deposition decreases the current in the accumulation mode of electrons due to electron mobility decrease at VG > 0, and enhances the current in inversion mode. Besides, PCBM deposition also results in an increase of hole mobility at VG < 0.
publishDate 2018
dc.date.none.fl_str_mv 2018-12-01
2019-10-06T15:20:53Z
2019-10-06T15:20:53Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1007/s10854-018-0131-9
Journal of Materials Science: Materials in Electronics, v. 29, n. 23, p. 20010-20016, 2018.
1573-482X
0957-4522
http://hdl.handle.net/11449/186952
10.1007/s10854-018-0131-9
2-s2.0-85054807144
url http://dx.doi.org/10.1007/s10854-018-0131-9
http://hdl.handle.net/11449/186952
identifier_str_mv Journal of Materials Science: Materials in Electronics, v. 29, n. 23, p. 20010-20016, 2018.
1573-482X
0957-4522
10.1007/s10854-018-0131-9
2-s2.0-85054807144
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Journal of Materials Science: Materials in Electronics
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 20010-20016
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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