Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene
Autor(a) principal: | |
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Data de Publicação: | 2018 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1007/s10854-018-0131-9 http://hdl.handle.net/11449/186952 |
Resumo: | In this article, the effect of phenyl-C61-butyric acid methyl ester (PCBM) layer on the electrical performance of field-effect transistors (FETs) based on antimony-doped tin dioxide (Sb:SnO2) is reported. PCBM is a soluble variety of fullerene, n-type organic semiconductor, known to promote the p-type doping of semiconducting materials such as diamond and graphene, via charge transfer. Sb:SnO2 is an emerging low-cost transparent oxide semiconductor material that exhibits strong unipolar behavior (n-type). Ambipolar character in tin dioxide normally is not observed, however in this study we find that the deposition of PCBM on top of Sb:SnO2 promotes ambipolar behavior in Sb:SnO2 FETs. At negative gate bias (VG < 0) PCBM traps free electrons from the conduction band of SnO2 and from Sb donors, thus downshifting the Sb:SnO2 Fermi level (EF), leading to a strong injection of holes in the valence band of Sb:SnO2. The p-type carrier concentration increases up to 8.6 × 1011 cm−2. Our results suggest that PCBM deposition decreases the current in the accumulation mode of electrons due to electron mobility decrease at VG > 0, and enhances the current in inversion mode. Besides, PCBM deposition also results in an increase of hole mobility at VG < 0. |
id |
UNSP_f4df56cde7725d6c44f3adc7694985c5 |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/186952 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullereneIn this article, the effect of phenyl-C61-butyric acid methyl ester (PCBM) layer on the electrical performance of field-effect transistors (FETs) based on antimony-doped tin dioxide (Sb:SnO2) is reported. PCBM is a soluble variety of fullerene, n-type organic semiconductor, known to promote the p-type doping of semiconducting materials such as diamond and graphene, via charge transfer. Sb:SnO2 is an emerging low-cost transparent oxide semiconductor material that exhibits strong unipolar behavior (n-type). Ambipolar character in tin dioxide normally is not observed, however in this study we find that the deposition of PCBM on top of Sb:SnO2 promotes ambipolar behavior in Sb:SnO2 FETs. At negative gate bias (VG < 0) PCBM traps free electrons from the conduction band of SnO2 and from Sb donors, thus downshifting the Sb:SnO2 Fermi level (EF), leading to a strong injection of holes in the valence band of Sb:SnO2. The p-type carrier concentration increases up to 8.6 × 1011 cm−2. Our results suggest that PCBM deposition decreases the current in the accumulation mode of electrons due to electron mobility decrease at VG > 0, and enhances the current in inversion mode. Besides, PCBM deposition also results in an increase of hole mobility at VG < 0.Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of CanadaDepartment of Physics Post-Graduate Program in Physics Federal University of Santa Catarina (UFSC)Department of Physics School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology São Paulo State University (UNESP)Department of Physics and Astronomy University of Western OntarioCentre of Advanced Materials and Biomaterials Research (CAMBR) University of Western OntarioDepartment of Chemistry University of Western OntarioDepartment of Physics School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology São Paulo State University (UNESP)CNPq: 471359/2013-0Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada: RGPIN-2015-06004Universidade Federal de Santa Catarina (UFSC)Universidade Estadual Paulista (Unesp)University of Western OntarioBoratto, Miguel H. [UNESP]Scalvi, Luis V. A. [UNESP]Goncharova, Lyudmila V.Fanchini, Giovanni2019-10-06T15:20:53Z2019-10-06T15:20:53Z2018-12-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article20010-20016http://dx.doi.org/10.1007/s10854-018-0131-9Journal of Materials Science: Materials in Electronics, v. 29, n. 23, p. 20010-20016, 2018.1573-482X0957-4522http://hdl.handle.net/11449/18695210.1007/s10854-018-0131-92-s2.0-85054807144Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengJournal of Materials Science: Materials in Electronicsinfo:eu-repo/semantics/openAccess2021-10-23T05:33:24Zoai:repositorio.unesp.br:11449/186952Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462021-10-23T05:33:24Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene |
title |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene |
spellingShingle |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene Boratto, Miguel H. [UNESP] |
title_short |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene |
title_full |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene |
title_fullStr |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene |
title_full_unstemmed |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene |
title_sort |
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene |
author |
Boratto, Miguel H. [UNESP] |
author_facet |
Boratto, Miguel H. [UNESP] Scalvi, Luis V. A. [UNESP] Goncharova, Lyudmila V. Fanchini, Giovanni |
author_role |
author |
author2 |
Scalvi, Luis V. A. [UNESP] Goncharova, Lyudmila V. Fanchini, Giovanni |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
Universidade Federal de Santa Catarina (UFSC) Universidade Estadual Paulista (Unesp) University of Western Ontario |
dc.contributor.author.fl_str_mv |
Boratto, Miguel H. [UNESP] Scalvi, Luis V. A. [UNESP] Goncharova, Lyudmila V. Fanchini, Giovanni |
description |
In this article, the effect of phenyl-C61-butyric acid methyl ester (PCBM) layer on the electrical performance of field-effect transistors (FETs) based on antimony-doped tin dioxide (Sb:SnO2) is reported. PCBM is a soluble variety of fullerene, n-type organic semiconductor, known to promote the p-type doping of semiconducting materials such as diamond and graphene, via charge transfer. Sb:SnO2 is an emerging low-cost transparent oxide semiconductor material that exhibits strong unipolar behavior (n-type). Ambipolar character in tin dioxide normally is not observed, however in this study we find that the deposition of PCBM on top of Sb:SnO2 promotes ambipolar behavior in Sb:SnO2 FETs. At negative gate bias (VG < 0) PCBM traps free electrons from the conduction band of SnO2 and from Sb donors, thus downshifting the Sb:SnO2 Fermi level (EF), leading to a strong injection of holes in the valence band of Sb:SnO2. The p-type carrier concentration increases up to 8.6 × 1011 cm−2. Our results suggest that PCBM deposition decreases the current in the accumulation mode of electrons due to electron mobility decrease at VG > 0, and enhances the current in inversion mode. Besides, PCBM deposition also results in an increase of hole mobility at VG < 0. |
publishDate |
2018 |
dc.date.none.fl_str_mv |
2018-12-01 2019-10-06T15:20:53Z 2019-10-06T15:20:53Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1007/s10854-018-0131-9 Journal of Materials Science: Materials in Electronics, v. 29, n. 23, p. 20010-20016, 2018. 1573-482X 0957-4522 http://hdl.handle.net/11449/186952 10.1007/s10854-018-0131-9 2-s2.0-85054807144 |
url |
http://dx.doi.org/10.1007/s10854-018-0131-9 http://hdl.handle.net/11449/186952 |
identifier_str_mv |
Journal of Materials Science: Materials in Electronics, v. 29, n. 23, p. 20010-20016, 2018. 1573-482X 0957-4522 10.1007/s10854-018-0131-9 2-s2.0-85054807144 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Journal of Materials Science: Materials in Electronics |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
20010-20016 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1803047189123956736 |