Study of Electromigration in Integrated Circuits at Design Level

Detalhes bibliográficos
Autor(a) principal: Rafael Oliveira Nunes
Data de Publicação: 2020
Tipo de documento: Tese
Título da fonte: Portal de Dados Abertos da CAPES
Texto Completo: https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9933784
id BRCRIS_b5d2af5d1a609321b451a31eae36aaec
network_acronym_str CAPES
network_name_str Portal de Dados Abertos da CAPES
dc.title.pt-BR.fl_str_mv Study of Electromigration in Integrated Circuits at Design Level
title Study of Electromigration in Integrated Circuits at Design Level
spellingShingle Study of Electromigration in Integrated Circuits at Design Level
projeto de circuito integrado
integrated circuit design
Rafael Oliveira Nunes
title_short Study of Electromigration in Integrated Circuits at Design Level
title_full Study of Electromigration in Integrated Circuits at Design Level
title_fullStr Study of Electromigration in Integrated Circuits at Design Level
Study of Electromigration in Integrated Circuits at Design Level
title_full_unstemmed Study of Electromigration in Integrated Circuits at Design Level
Study of Electromigration in Integrated Circuits at Design Level
title_sort Study of Electromigration in Integrated Circuits at Design Level
topic projeto de circuito integrado
integrated circuit design
publishDate 2020
format doctoralThesis
url https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9933784
author_role author
author Rafael Oliveira Nunes
author_facet Rafael Oliveira Nunes
dc.contributor.authorLattes.fl_str_mv http://lattes.cnpq.br/1309786111812453
dc.publisher.none.fl_str_mv UNIVERSIDADE ESTADUAL DE CAMPINAS
publisher.none.fl_str_mv UNIVERSIDADE ESTADUAL DE CAMPINAS
instname_str UNIVERSIDADE ESTADUAL DE CAMPINAS
dc.publisher.program.fl_str_mv ENGENHARIA ELÉTRICA
dc.description.course.none.fl_txt_mv ENGENHARIA ELÉTRICA
reponame_str Portal de Dados Abertos da CAPES
collection Portal de Dados Abertos da CAPES
spelling CAPESPortal de Dados Abertos da CAPESStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design Levelprojeto de circuito integrado2020doctoralThesishttps://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9933784authorRafael Oliveira Nuneshttp://lattes.cnpq.br/1309786111812453UNIVERSIDADE ESTADUAL DE CAMPINASUNIVERSIDADE ESTADUAL DE CAMPINASUNIVERSIDADE ESTADUAL DE CAMPINASENGENHARIA ELÉTRICAENGENHARIA ELÉTRICAPortal de Dados Abertos da CAPESPortal de Dados Abertos da CAPES
identifier_str_mv Nunes, Rafael Oliveira. Study of Electromigration in Integrated Circuits at Design Level. 2020. Tese.
dc.identifier.citation.fl_str_mv Nunes, Rafael Oliveira. Study of Electromigration in Integrated Circuits at Design Level. 2020. Tese.
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