Study of Electromigration in Integrated Circuits at Design Level
Autor(a) principal: | |
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Data de Publicação: | 2020 |
Tipo de documento: | Tese |
Título da fonte: | Portal de Dados Abertos da CAPES |
Texto Completo: | https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9933784 |
id |
BRCRIS_b5d2af5d1a609321b451a31eae36aaec |
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network_acronym_str |
CAPES |
network_name_str |
Portal de Dados Abertos da CAPES |
dc.title.pt-BR.fl_str_mv |
Study of Electromigration in Integrated Circuits at Design Level |
title |
Study of Electromigration in Integrated Circuits at Design Level |
spellingShingle |
Study of Electromigration in Integrated Circuits at Design Level projeto de circuito integrado integrated circuit design Rafael Oliveira Nunes |
title_short |
Study of Electromigration in Integrated Circuits at Design Level |
title_full |
Study of Electromigration in Integrated Circuits at Design Level |
title_fullStr |
Study of Electromigration in Integrated Circuits at Design Level Study of Electromigration in Integrated Circuits at Design Level |
title_full_unstemmed |
Study of Electromigration in Integrated Circuits at Design Level Study of Electromigration in Integrated Circuits at Design Level |
title_sort |
Study of Electromigration in Integrated Circuits at Design Level |
topic |
projeto de circuito integrado integrated circuit design |
publishDate |
2020 |
format |
doctoralThesis |
url |
https://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9933784 |
author_role |
author |
author |
Rafael Oliveira Nunes |
author_facet |
Rafael Oliveira Nunes |
dc.contributor.authorLattes.fl_str_mv |
http://lattes.cnpq.br/1309786111812453 |
dc.publisher.none.fl_str_mv |
UNIVERSIDADE ESTADUAL DE CAMPINAS |
publisher.none.fl_str_mv |
UNIVERSIDADE ESTADUAL DE CAMPINAS |
instname_str |
UNIVERSIDADE ESTADUAL DE CAMPINAS |
dc.publisher.program.fl_str_mv |
ENGENHARIA ELÉTRICA |
dc.description.course.none.fl_txt_mv |
ENGENHARIA ELÉTRICA |
reponame_str |
Portal de Dados Abertos da CAPES |
collection |
Portal de Dados Abertos da CAPES |
spelling |
CAPESPortal de Dados Abertos da CAPESStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design LevelStudy of Electromigration in Integrated Circuits at Design Levelprojeto de circuito integrado2020doctoralThesishttps://sucupira.capes.gov.br/sucupira/public/consultas/coleta/trabalhoConclusao/viewTrabalhoConclusao.jsf?popup=true&id_trabalho=9933784authorRafael Oliveira Nuneshttp://lattes.cnpq.br/1309786111812453UNIVERSIDADE ESTADUAL DE CAMPINASUNIVERSIDADE ESTADUAL DE CAMPINASUNIVERSIDADE ESTADUAL DE CAMPINASENGENHARIA ELÉTRICAENGENHARIA ELÉTRICAPortal de Dados Abertos da CAPESPortal de Dados Abertos da CAPES |
identifier_str_mv |
Nunes, Rafael Oliveira. Study of Electromigration in Integrated Circuits at Design Level. 2020. Tese. |
dc.identifier.citation.fl_str_mv |
Nunes, Rafael Oliveira. Study of Electromigration in Integrated Circuits at Design Level. 2020. Tese. |
_version_ |
1741885592201854976 |