Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology
Autor(a) principal: | |
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Data de Publicação: | 2002 |
Outros Autores: | , , |
Tipo de documento: | Livro |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | https://hdl.handle.net/10216/84940 |
Resumo: | The increasing use of reconfigurable computing platforms, employing SRAM-based FPGAs, opens exciting new possibilities since they enable the reutilization of same hardware resources to implement speed-critical computational tasks, without interrupting system operation. Nevertheless, larger dies and the use of smaller submicron scales in the manufacturing of this new kind of FPGAs increase the probability of lifetime operation failures, requiring new test / fault tolerance methods capable of assuring the reliability of the system. Structural concurrent test procedures become particularly important in this context, since it is now possible to replicate and release for test internal FPGA resources, concurrently with but not affecting system operation. A new dynamic replication process of active Configurable Logic Blocks (CLBs) is presented in this paper, which enables the implementation of a truly non-intrusive structural component test approach. The experimental results presented prove the effectiveness of this solution. |
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7160 |
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Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodologyEngenharia electrotécnica, Engenharia electrotécnica, electrónica e informáticaElectrical engineering, Electrical engineering, Electronic engineering, Information engineeringThe increasing use of reconfigurable computing platforms, employing SRAM-based FPGAs, opens exciting new possibilities since they enable the reutilization of same hardware resources to implement speed-critical computational tasks, without interrupting system operation. Nevertheless, larger dies and the use of smaller submicron scales in the manufacturing of this new kind of FPGAs increase the probability of lifetime operation failures, requiring new test / fault tolerance methods capable of assuring the reliability of the system. Structural concurrent test procedures become particularly important in this context, since it is now possible to replicate and release for test internal FPGA resources, concurrently with but not affecting system operation. A new dynamic replication process of active Configurable Logic Blocks (CLBs) is presented in this paper, which enables the implementation of a truly non-intrusive structural component test approach. The experimental results presented prove the effectiveness of this solution.20022002-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/bookapplication/pdfhttps://hdl.handle.net/10216/84940engManuel G. GericotaGustavo R. AlvesMiguel L. SilvaJosé M. Ferreirainfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-11-29T13:26:33Zoai:repositorio-aberto.up.pt:10216/84940Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T23:40:33.426196Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology |
title |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology |
spellingShingle |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology Manuel G. Gericota Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática Electrical engineering, Electrical engineering, Electronic engineering, Information engineering |
title_short |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology |
title_full |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology |
title_fullStr |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology |
title_full_unstemmed |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology |
title_sort |
Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology |
author |
Manuel G. Gericota |
author_facet |
Manuel G. Gericota Gustavo R. Alves Miguel L. Silva José M. Ferreira |
author_role |
author |
author2 |
Gustavo R. Alves Miguel L. Silva José M. Ferreira |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Manuel G. Gericota Gustavo R. Alves Miguel L. Silva José M. Ferreira |
dc.subject.por.fl_str_mv |
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática Electrical engineering, Electrical engineering, Electronic engineering, Information engineering |
topic |
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática Electrical engineering, Electrical engineering, Electronic engineering, Information engineering |
description |
The increasing use of reconfigurable computing platforms, employing SRAM-based FPGAs, opens exciting new possibilities since they enable the reutilization of same hardware resources to implement speed-critical computational tasks, without interrupting system operation. Nevertheless, larger dies and the use of smaller submicron scales in the manufacturing of this new kind of FPGAs increase the probability of lifetime operation failures, requiring new test / fault tolerance methods capable of assuring the reliability of the system. Structural concurrent test procedures become particularly important in this context, since it is now possible to replicate and release for test internal FPGA resources, concurrently with but not affecting system operation. A new dynamic replication process of active Configurable Logic Blocks (CLBs) is presented in this paper, which enables the implementation of a truly non-intrusive structural component test approach. The experimental results presented prove the effectiveness of this solution. |
publishDate |
2002 |
dc.date.none.fl_str_mv |
2002 2002-01-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/book |
format |
book |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
https://hdl.handle.net/10216/84940 |
url |
https://hdl.handle.net/10216/84940 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
instname_str |
Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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1799135720201256960 |