Performance of differential pair circuits designed with line tunnel FET devices at different temperatures
Autor(a) principal: | |
---|---|
Data de Publicação: | 2018 |
Outros Autores: | , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1088/1361-6641/aac4fd http://hdl.handle.net/11449/171203 |
Resumo: | This work studies differential pair circuits designed with Line tunnel field effect transistors (TFETs), comparing their suitability with conventional Point TFETs. Differential voltage gain (A d), compliance voltage and sensitivity to channel length mismatch are analyzed experimentally for different temperatures. The first part highlights individual characteristics of Line TFETs, focusing on behaviors that affect analog circuits. In comparison to Point TFETs, Line TFETs present higher drive current, better transconductance and worse output conductance. In the second part, differential pairs are studied at room temperature for different dimensions and bias conditions. Line TFETs present the highest A d, while Point TFET decrease the susceptibility to channel length mismatch. In the last part, the temperature impact is investigated. Based on the activation energy, the impact of band-to-band tunneling and trap-assisted tunneling is discussed for different bias conditions. A general equation is proposed, including the technology and the susceptibility to temperature and dimensions. It was observed that Line TFETs are a good option to design differential pairs with higher A d and ON-state current than Point TFETs. |
id |
UNSP_f542a10cda58e7299d39b449cffb13cc |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/171203 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
Performance of differential pair circuits designed with line tunnel FET devices at different temperaturesanalog performancedifferential pairFinFETLine TFETPoint TFETThis work studies differential pair circuits designed with Line tunnel field effect transistors (TFETs), comparing their suitability with conventional Point TFETs. Differential voltage gain (A d), compliance voltage and sensitivity to channel length mismatch are analyzed experimentally for different temperatures. The first part highlights individual characteristics of Line TFETs, focusing on behaviors that affect analog circuits. In comparison to Point TFETs, Line TFETs present higher drive current, better transconductance and worse output conductance. In the second part, differential pairs are studied at room temperature for different dimensions and bias conditions. Line TFETs present the highest A d, while Point TFET decrease the susceptibility to channel length mismatch. In the last part, the temperature impact is investigated. Based on the activation energy, the impact of band-to-band tunneling and trap-assisted tunneling is discussed for different bias conditions. A general equation is proposed, including the technology and the susceptibility to temperature and dimensions. It was observed that Line TFETs are a good option to design differential pairs with higher A d and ON-state current than Point TFETs.LSI/PSI/USP University of Sao PauloSao Paulo State University (UNESP) Campus Sao Joao da Boa VistaImecE.E. Department KU LeuvenSao Paulo State University (UNESP) Campus Sao Joao da Boa VistaUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)ImecKU LeuvenMartino, M. D.V.Martino, J. A.Agopian, P. G.D. [UNESP]Rooyackers, R.Simoen, E.Collaert, N.Claeys, C.2018-12-11T16:54:23Z2018-12-11T16:54:23Z2018-06-06info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://dx.doi.org/10.1088/1361-6641/aac4fdSemiconductor Science and Technology, v. 33, n. 7, 2018.1361-66410268-1242http://hdl.handle.net/11449/17120310.1088/1361-6641/aac4fd2-s2.0-850497751562-s2.0-85049775156.pdf04969095954656960000-0002-0886-7798Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengSemiconductor Science and Technology0,7570,757info:eu-repo/semantics/openAccess2023-10-18T06:04:55Zoai:repositorio.unesp.br:11449/171203Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462023-10-18T06:04:55Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures |
title |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures |
spellingShingle |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures Martino, M. D.V. analog performance differential pair FinFET Line TFET Point TFET |
title_short |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures |
title_full |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures |
title_fullStr |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures |
title_full_unstemmed |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures |
title_sort |
Performance of differential pair circuits designed with line tunnel FET devices at different temperatures |
author |
Martino, M. D.V. |
author_facet |
Martino, M. D.V. Martino, J. A. Agopian, P. G.D. [UNESP] Rooyackers, R. Simoen, E. Collaert, N. Claeys, C. |
author_role |
author |
author2 |
Martino, J. A. Agopian, P. G.D. [UNESP] Rooyackers, R. Simoen, E. Collaert, N. Claeys, C. |
author2_role |
author author author author author author |
dc.contributor.none.fl_str_mv |
Universidade de São Paulo (USP) Universidade Estadual Paulista (Unesp) Imec KU Leuven |
dc.contributor.author.fl_str_mv |
Martino, M. D.V. Martino, J. A. Agopian, P. G.D. [UNESP] Rooyackers, R. Simoen, E. Collaert, N. Claeys, C. |
dc.subject.por.fl_str_mv |
analog performance differential pair FinFET Line TFET Point TFET |
topic |
analog performance differential pair FinFET Line TFET Point TFET |
description |
This work studies differential pair circuits designed with Line tunnel field effect transistors (TFETs), comparing their suitability with conventional Point TFETs. Differential voltage gain (A d), compliance voltage and sensitivity to channel length mismatch are analyzed experimentally for different temperatures. The first part highlights individual characteristics of Line TFETs, focusing on behaviors that affect analog circuits. In comparison to Point TFETs, Line TFETs present higher drive current, better transconductance and worse output conductance. In the second part, differential pairs are studied at room temperature for different dimensions and bias conditions. Line TFETs present the highest A d, while Point TFET decrease the susceptibility to channel length mismatch. In the last part, the temperature impact is investigated. Based on the activation energy, the impact of band-to-band tunneling and trap-assisted tunneling is discussed for different bias conditions. A general equation is proposed, including the technology and the susceptibility to temperature and dimensions. It was observed that Line TFETs are a good option to design differential pairs with higher A d and ON-state current than Point TFETs. |
publishDate |
2018 |
dc.date.none.fl_str_mv |
2018-12-11T16:54:23Z 2018-12-11T16:54:23Z 2018-06-06 |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1088/1361-6641/aac4fd Semiconductor Science and Technology, v. 33, n. 7, 2018. 1361-6641 0268-1242 http://hdl.handle.net/11449/171203 10.1088/1361-6641/aac4fd 2-s2.0-85049775156 2-s2.0-85049775156.pdf 0496909595465696 0000-0002-0886-7798 |
url |
http://dx.doi.org/10.1088/1361-6641/aac4fd http://hdl.handle.net/11449/171203 |
identifier_str_mv |
Semiconductor Science and Technology, v. 33, n. 7, 2018. 1361-6641 0268-1242 10.1088/1361-6641/aac4fd 2-s2.0-85049775156 2-s2.0-85049775156.pdf 0496909595465696 0000-0002-0886-7798 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Semiconductor Science and Technology 0,757 0,757 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1803046046047141888 |