On the assessment of electrically active defects in high-mobility materials and devices
| Autor(a) principal: | |
|---|---|
| Data de Publicação: | 2016 |
| Outros Autores: | , , , , , , , , , , , , , , , |
| Tipo de documento: | Artigo de conferência |
| Idioma: | eng |
| Título da fonte: | Repositório Institucional da UNESP |
| Texto Completo: | http://hdl.handle.net/11449/184616 |
Resumo: | A possible strategy for the characterization of grown-in and processing-induced electrically active point and extended defects in high-mobility substrates is presented and illustrated by examples obtained on Ge as a prototype system. |
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On the assessment of electrically active defects in high-mobility materials and devicesA possible strategy for the characterization of grown-in and processing-induced electrically active point and extended defects in high-mobility substrates is presented and illustrated by examples obtained on Ge as a prototype system.IMEC, Kapeldreef 75, B-300 Leuven, BelgiumUniv Ghent, Depart Solid State Sci, Krijgslaan 281 S1, B-9000 Ghent, BelgiumUniv Sao Paulo, Sao Paulo, BrazilVanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USAUniv Estadual Paulista, Sao Paulo, BrazilKatholieke Univ Leuven, EE Depart, Kasteelpk Arenberg 10, B-3001 Leuven, BelgiumUniv Estadual Paulista, Sao Paulo, BrazilIeeeIMECUniv GhentUniversidade de São Paulo (USP)Vanderbilt UnivUniversidade Estadual Paulista (Unesp)Katholieke Univ LeuvenSimoen, EddyEneman, GeertOliveira, Alberto Vinicius deNi, KaiMitard, JeromeWitters, LiesbethDer Agopian, Paula Ghedini [UNESP]Martino, Joao AntonioFleetwood, Daniel M.Schrimpf, Ronald D.Reed, Robert A.Collaert, NadineThean, AaronClaeys, CorJiang, Y. L.Tang, T. A.Huang, R.2019-10-04T12:15:15Z2019-10-04T12:15:15Z2016-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject300-3032016 13th Ieee International Conference On Solid-state And Integrated Circuit Technology (icsict). New York: Ieee, p. 300-303, 2016.http://hdl.handle.net/11449/184616WOS:000478951000079Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2016 13th Ieee International Conference On Solid-state And Integrated Circuit Technology (icsict)info:eu-repo/semantics/openAccess2021-10-22T21:15:50Zoai:repositorio.unesp.br:11449/184616Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462021-10-22T21:15:50Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
| dc.title.none.fl_str_mv |
On the assessment of electrically active defects in high-mobility materials and devices |
| title |
On the assessment of electrically active defects in high-mobility materials and devices |
| spellingShingle |
On the assessment of electrically active defects in high-mobility materials and devices Simoen, Eddy |
| title_short |
On the assessment of electrically active defects in high-mobility materials and devices |
| title_full |
On the assessment of electrically active defects in high-mobility materials and devices |
| title_fullStr |
On the assessment of electrically active defects in high-mobility materials and devices |
| title_full_unstemmed |
On the assessment of electrically active defects in high-mobility materials and devices |
| title_sort |
On the assessment of electrically active defects in high-mobility materials and devices |
| author |
Simoen, Eddy |
| author_facet |
Simoen, Eddy Eneman, Geert Oliveira, Alberto Vinicius de Ni, Kai Mitard, Jerome Witters, Liesbeth Der Agopian, Paula Ghedini [UNESP] Martino, Joao Antonio Fleetwood, Daniel M. Schrimpf, Ronald D. Reed, Robert A. Collaert, Nadine Thean, Aaron Claeys, Cor Jiang, Y. L. Tang, T. A. Huang, R. |
| author_role |
author |
| author2 |
Eneman, Geert Oliveira, Alberto Vinicius de Ni, Kai Mitard, Jerome Witters, Liesbeth Der Agopian, Paula Ghedini [UNESP] Martino, Joao Antonio Fleetwood, Daniel M. Schrimpf, Ronald D. Reed, Robert A. Collaert, Nadine Thean, Aaron Claeys, Cor Jiang, Y. L. Tang, T. A. Huang, R. |
| author2_role |
author author author author author author author author author author author author author author author author |
| dc.contributor.none.fl_str_mv |
IMEC Univ Ghent Universidade de São Paulo (USP) Vanderbilt Univ Universidade Estadual Paulista (Unesp) Katholieke Univ Leuven |
| dc.contributor.author.fl_str_mv |
Simoen, Eddy Eneman, Geert Oliveira, Alberto Vinicius de Ni, Kai Mitard, Jerome Witters, Liesbeth Der Agopian, Paula Ghedini [UNESP] Martino, Joao Antonio Fleetwood, Daniel M. Schrimpf, Ronald D. Reed, Robert A. Collaert, Nadine Thean, Aaron Claeys, Cor Jiang, Y. L. Tang, T. A. Huang, R. |
| description |
A possible strategy for the characterization of grown-in and processing-induced electrically active point and extended defects in high-mobility substrates is presented and illustrated by examples obtained on Ge as a prototype system. |
| publishDate |
2016 |
| dc.date.none.fl_str_mv |
2016-01-01 2019-10-04T12:15:15Z 2019-10-04T12:15:15Z |
| dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
| dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
| format |
conferenceObject |
| status_str |
publishedVersion |
| dc.identifier.uri.fl_str_mv |
2016 13th Ieee International Conference On Solid-state And Integrated Circuit Technology (icsict). New York: Ieee, p. 300-303, 2016. http://hdl.handle.net/11449/184616 WOS:000478951000079 |
| identifier_str_mv |
2016 13th Ieee International Conference On Solid-state And Integrated Circuit Technology (icsict). New York: Ieee, p. 300-303, 2016. WOS:000478951000079 |
| url |
http://hdl.handle.net/11449/184616 |
| dc.language.iso.fl_str_mv |
eng |
| language |
eng |
| dc.relation.none.fl_str_mv |
2016 13th Ieee International Conference On Solid-state And Integrated Circuit Technology (icsict) |
| dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
| dc.format.none.fl_str_mv |
300-303 |
| dc.publisher.none.fl_str_mv |
Ieee |
| publisher.none.fl_str_mv |
Ieee |
| dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
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Universidade Estadual Paulista (UNESP) |
| instacron_str |
UNESP |
| institution |
UNESP |
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Repositório Institucional da UNESP |
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Repositório Institucional da UNESP |
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Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
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1803046896211591168 |