Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References

Detalhes bibliográficos
Autor(a) principal: Both,Thiago Hanna
Data de Publicação: 2013
Outros Autores: Colombo,Dalton, Dallasen,Ricardo Vanni, Wirth,Gilson Inácio
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Journal of Aerospace Technology and Management (Online)
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335
Resumo: ABSTRACT: The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 µm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage.
id DCTA-1_4bb62d3f2a92ac201f5d46695c94e0ed
oai_identifier_str oai:scielo:S2175-91462013000300335
network_acronym_str DCTA-1
network_name_str Journal of Aerospace Technology and Management (Online)
repository_id_str
spelling Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage ReferencesIonizing doseRadiationTIDVoltage referenceABSTRACT: The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 µm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage.Departamento de Ciência e Tecnologia Aeroespacial2013-09-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335Journal of Aerospace Technology and Management v.5 n.3 2013reponame:Journal of Aerospace Technology and Management (Online)instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA)instacron:DCTA10.5028/jatm.v5i3.227info:eu-repo/semantics/openAccessBoth,Thiago HannaColombo,DaltonDallasen,Ricardo VanniWirth,Gilson Inácioeng2017-05-24T00:00:00Zoai:scielo:S2175-91462013000300335Revistahttp://www.jatm.com.br/ONGhttps://old.scielo.br/oai/scielo-oai.php||secretary@jatm.com.br2175-91461984-9648opendoar:2017-05-24T00:00Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA)false
dc.title.none.fl_str_mv Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
title Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
spellingShingle Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
Both,Thiago Hanna
Ionizing dose
Radiation
TID
Voltage reference
title_short Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
title_full Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
title_fullStr Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
title_full_unstemmed Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
title_sort Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
author Both,Thiago Hanna
author_facet Both,Thiago Hanna
Colombo,Dalton
Dallasen,Ricardo Vanni
Wirth,Gilson Inácio
author_role author
author2 Colombo,Dalton
Dallasen,Ricardo Vanni
Wirth,Gilson Inácio
author2_role author
author
author
dc.contributor.author.fl_str_mv Both,Thiago Hanna
Colombo,Dalton
Dallasen,Ricardo Vanni
Wirth,Gilson Inácio
dc.subject.por.fl_str_mv Ionizing dose
Radiation
TID
Voltage reference
topic Ionizing dose
Radiation
TID
Voltage reference
description ABSTRACT: The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 µm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage.
publishDate 2013
dc.date.none.fl_str_mv 2013-09-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.5028/jatm.v5i3.227
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Departamento de Ciência e Tecnologia Aeroespacial
publisher.none.fl_str_mv Departamento de Ciência e Tecnologia Aeroespacial
dc.source.none.fl_str_mv Journal of Aerospace Technology and Management v.5 n.3 2013
reponame:Journal of Aerospace Technology and Management (Online)
instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA)
instacron:DCTA
instname_str Departamento de Ciência e Tecnologia Aeroespacial (DCTA)
instacron_str DCTA
institution DCTA
reponame_str Journal of Aerospace Technology and Management (Online)
collection Journal of Aerospace Technology and Management (Online)
repository.name.fl_str_mv Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA)
repository.mail.fl_str_mv ||secretary@jatm.com.br
_version_ 1754732530830934016

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