Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
Autor(a) principal: | |
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Data de Publicação: | 2013 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Journal of Aerospace Technology and Management (Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335 |
Resumo: | ABSTRACT: The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 µm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage. |
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Journal of Aerospace Technology and Management (Online) |
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Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage ReferencesIonizing doseRadiationTIDVoltage referenceABSTRACT: The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 µm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage.Departamento de Ciência e Tecnologia Aeroespacial2013-09-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335Journal of Aerospace Technology and Management v.5 n.3 2013reponame:Journal of Aerospace Technology and Management (Online)instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA)instacron:DCTA10.5028/jatm.v5i3.227info:eu-repo/semantics/openAccessBoth,Thiago HannaColombo,DaltonDallasen,Ricardo VanniWirth,Gilson Inácioeng2017-05-24T00:00:00Zoai:scielo:S2175-91462013000300335Revistahttp://www.jatm.com.br/ONGhttps://old.scielo.br/oai/scielo-oai.php||secretary@jatm.com.br2175-91461984-9648opendoar:2017-05-24T00:00Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA)false |
dc.title.none.fl_str_mv |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References |
title |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References |
spellingShingle |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References Both,Thiago Hanna Ionizing dose Radiation TID Voltage reference |
title_short |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References |
title_full |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References |
title_fullStr |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References |
title_full_unstemmed |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References |
title_sort |
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References |
author |
Both,Thiago Hanna |
author_facet |
Both,Thiago Hanna Colombo,Dalton Dallasen,Ricardo Vanni Wirth,Gilson Inácio |
author_role |
author |
author2 |
Colombo,Dalton Dallasen,Ricardo Vanni Wirth,Gilson Inácio |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Both,Thiago Hanna Colombo,Dalton Dallasen,Ricardo Vanni Wirth,Gilson Inácio |
dc.subject.por.fl_str_mv |
Ionizing dose Radiation TID Voltage reference |
topic |
Ionizing dose Radiation TID Voltage reference |
description |
ABSTRACT: The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 µm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage. |
publishDate |
2013 |
dc.date.none.fl_str_mv |
2013-09-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462013000300335 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.5028/jatm.v5i3.227 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Departamento de Ciência e Tecnologia Aeroespacial |
publisher.none.fl_str_mv |
Departamento de Ciência e Tecnologia Aeroespacial |
dc.source.none.fl_str_mv |
Journal of Aerospace Technology and Management v.5 n.3 2013 reponame:Journal of Aerospace Technology and Management (Online) instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA) instacron:DCTA |
instname_str |
Departamento de Ciência e Tecnologia Aeroespacial (DCTA) |
instacron_str |
DCTA |
institution |
DCTA |
reponame_str |
Journal of Aerospace Technology and Management (Online) |
collection |
Journal of Aerospace Technology and Management (Online) |
repository.name.fl_str_mv |
Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA) |
repository.mail.fl_str_mv |
||secretary@jatm.com.br |
_version_ |
1754732530830934016 |