Using bulk built-in current sensors to detect soft errors

Detalhes bibliográficos
Autor(a) principal: Henes Neto, Egas
Data de Publicação: 2006
Outros Autores: Ribeiro, Ivandro da Silva, Vieira, Michele Gusson, Wirth, Gilson Inacio, Kastensmidt, Fernanda Gusmão de Lima
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/27691
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spelling Henes Neto, EgasRibeiro, Ivandro da SilvaVieira, Michele GussonWirth, Gilson InacioKastensmidt, Fernanda Gusmão de Lima2011-02-08T05:59:20Z20060272-1732http://hdl.handle.net/10183/27691000578594application/pdfengIEEE micro : chips, systems, software, and applications. Los Alamitos. p. 10-18MicroeletrônicaUsing bulk built-in current sensors to detect soft errorsEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000578594.pdf000578594.pdfTexto completo (inglês)application/pdf2538997http://www.lume.ufrgs.br/bitstream/10183/27691/1/000578594.pdf1f27e00e4636372b2ba283f4ec694873MD51TEXT000578594.pdf.txt000578594.pdf.txtExtracted Texttext/plain28257http://www.lume.ufrgs.br/bitstream/10183/27691/2/000578594.pdf.txt8428dc7161e84ddfd5364afc31ce59d0MD52THUMBNAIL000578594.pdf.jpg000578594.pdf.jpgGenerated Thumbnailimage/jpeg1814http://www.lume.ufrgs.br/bitstream/10183/27691/3/000578594.pdf.jpgb0ad8f8081994ccff968b7e56d6ad3dfMD5310183/276912021-06-13 04:29:25.907188oai:www.lume.ufrgs.br:10183/27691Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2021-06-13T07:29:25Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Using bulk built-in current sensors to detect soft errors
title Using bulk built-in current sensors to detect soft errors
spellingShingle Using bulk built-in current sensors to detect soft errors
Henes Neto, Egas
Microeletrônica
title_short Using bulk built-in current sensors to detect soft errors
title_full Using bulk built-in current sensors to detect soft errors
title_fullStr Using bulk built-in current sensors to detect soft errors
title_full_unstemmed Using bulk built-in current sensors to detect soft errors
title_sort Using bulk built-in current sensors to detect soft errors
author Henes Neto, Egas
author_facet Henes Neto, Egas
Ribeiro, Ivandro da Silva
Vieira, Michele Gusson
Wirth, Gilson Inacio
Kastensmidt, Fernanda Gusmão de Lima
author_role author
author2 Ribeiro, Ivandro da Silva
Vieira, Michele Gusson
Wirth, Gilson Inacio
Kastensmidt, Fernanda Gusmão de Lima
author2_role author
author
author
author
dc.contributor.author.fl_str_mv Henes Neto, Egas
Ribeiro, Ivandro da Silva
Vieira, Michele Gusson
Wirth, Gilson Inacio
Kastensmidt, Fernanda Gusmão de Lima
dc.subject.por.fl_str_mv Microeletrônica
topic Microeletrônica
publishDate 2006
dc.date.issued.fl_str_mv 2006
dc.date.accessioned.fl_str_mv 2011-02-08T05:59:20Z
dc.type.driver.fl_str_mv Estrangeiro
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dc.relation.ispartof.pt_BR.fl_str_mv IEEE micro : chips, systems, software, and applications. Los Alamitos. p. 10-18
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