Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
Autor(a) principal: | |
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Data de Publicação: | 2004 |
Outros Autores: | , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/204817 |
Resumo: | Hard amorphous fluorinated carbon films (a-C:F) deposited by plasma enhanced chemical vapor deposition were annealed in vacuum for 30 min in the temperature range of 200–600 °C. The structural and compositional modifications were followed by several analytical techniques: Rutherford backscattering spectrometry (RBS), elastic recoil detection analysis (ERDA), x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Nanoidentation measurements and lateral force microscopy experiments were carried out in order to provide the film hardness and the friction coefficient, respectively. The internal stress and contact angle were also measured. RBS, ERDA, and XPS results indicate that both fluorine and hydrogen losses occur for annealing temperatures higher than 300 °C. Raman spectroscopy shows a progressive graphitization upon annealing, while the surface became slightly more hydrophobic as revealed by the increase of the contact angle. Following the surface wettability reduction, a decrease of the friction coefficient was observed. These results highlight the influence of the capillary condensation on the nanoscale friction. The film hardness and the internal stress are constant up to 300 °C and decrease for higher annealing temperatures, showing a direct correlation with the atomic density of the films. Since the thickness variation is negligible, the mass loss upon thermal treatment results in amorphous structures with a lower degree of cross-linking, explaining the deterioration of the mechanical properties of the a-C:F films. |
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Costa, Marcelo Eduardo Huguenin Maia daBaumvol, Israel Jacob RabinRadtke, ClaudioJacobsohn, Luiz GustavoZamora, R. R. M.Freire Junior, Fernando Lazaro2020-01-23T04:04:36Z20040734-2101http://hdl.handle.net/10183/204817000503690Hard amorphous fluorinated carbon films (a-C:F) deposited by plasma enhanced chemical vapor deposition were annealed in vacuum for 30 min in the temperature range of 200–600 °C. The structural and compositional modifications were followed by several analytical techniques: Rutherford backscattering spectrometry (RBS), elastic recoil detection analysis (ERDA), x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Nanoidentation measurements and lateral force microscopy experiments were carried out in order to provide the film hardness and the friction coefficient, respectively. The internal stress and contact angle were also measured. RBS, ERDA, and XPS results indicate that both fluorine and hydrogen losses occur for annealing temperatures higher than 300 °C. Raman spectroscopy shows a progressive graphitization upon annealing, while the surface became slightly more hydrophobic as revealed by the increase of the contact angle. Following the surface wettability reduction, a decrease of the friction coefficient was observed. These results highlight the influence of the capillary condensation on the nanoscale friction. The film hardness and the internal stress are constant up to 300 °C and decrease for higher annealing temperatures, showing a direct correlation with the atomic density of the films. Since the thickness variation is negligible, the mass loss upon thermal treatment results in amorphous structures with a lower degree of cross-linking, explaining the deterioration of the mechanical properties of the a-C:F films.application/pdfengJournal of Vacuum Science & Technology a : Vacuum, Surfaces and Films. New York. Vol. 22, no. 6 (Nov./Dec. 2004), p. 2321-2328Estado amorfoRecozimentoCarbonoPlasma CVDEspectroscopia RamanRetroespalhamento rutherfordFilmes finosEspectro de fotoeletrons produzidos por raios-xEffects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor depositionEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSTEXT000503690.pdf.txt000503690.pdf.txtExtracted Texttext/plain33664http://www.lume.ufrgs.br/bitstream/10183/204817/2/000503690.pdf.txt1f2fce5c6c8dbdeeb389a89a6e0cd8d3MD52ORIGINAL000503690.pdfTexto completo (inglês)application/pdf388894http://www.lume.ufrgs.br/bitstream/10183/204817/1/000503690.pdfc50f7e6cc916a84a458092c7621245a1MD5110183/2048172022-04-20 04:46:13.492322oai:www.lume.ufrgs.br:10183/204817Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2022-04-20T07:46:13Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition |
title |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition |
spellingShingle |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition Costa, Marcelo Eduardo Huguenin Maia da Estado amorfo Recozimento Carbono Plasma CVD Espectroscopia Raman Retroespalhamento rutherford Filmes finos Espectro de fotoeletrons produzidos por raios-x |
title_short |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition |
title_full |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition |
title_fullStr |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition |
title_full_unstemmed |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition |
title_sort |
Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition |
author |
Costa, Marcelo Eduardo Huguenin Maia da |
author_facet |
Costa, Marcelo Eduardo Huguenin Maia da Baumvol, Israel Jacob Rabin Radtke, Claudio Jacobsohn, Luiz Gustavo Zamora, R. R. M. Freire Junior, Fernando Lazaro |
author_role |
author |
author2 |
Baumvol, Israel Jacob Rabin Radtke, Claudio Jacobsohn, Luiz Gustavo Zamora, R. R. M. Freire Junior, Fernando Lazaro |
author2_role |
author author author author author |
dc.contributor.author.fl_str_mv |
Costa, Marcelo Eduardo Huguenin Maia da Baumvol, Israel Jacob Rabin Radtke, Claudio Jacobsohn, Luiz Gustavo Zamora, R. R. M. Freire Junior, Fernando Lazaro |
dc.subject.por.fl_str_mv |
Estado amorfo Recozimento Carbono Plasma CVD Espectroscopia Raman Retroespalhamento rutherford Filmes finos Espectro de fotoeletrons produzidos por raios-x |
topic |
Estado amorfo Recozimento Carbono Plasma CVD Espectroscopia Raman Retroespalhamento rutherford Filmes finos Espectro de fotoeletrons produzidos por raios-x |
description |
Hard amorphous fluorinated carbon films (a-C:F) deposited by plasma enhanced chemical vapor deposition were annealed in vacuum for 30 min in the temperature range of 200–600 °C. The structural and compositional modifications were followed by several analytical techniques: Rutherford backscattering spectrometry (RBS), elastic recoil detection analysis (ERDA), x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Nanoidentation measurements and lateral force microscopy experiments were carried out in order to provide the film hardness and the friction coefficient, respectively. The internal stress and contact angle were also measured. RBS, ERDA, and XPS results indicate that both fluorine and hydrogen losses occur for annealing temperatures higher than 300 °C. Raman spectroscopy shows a progressive graphitization upon annealing, while the surface became slightly more hydrophobic as revealed by the increase of the contact angle. Following the surface wettability reduction, a decrease of the friction coefficient was observed. These results highlight the influence of the capillary condensation on the nanoscale friction. The film hardness and the internal stress are constant up to 300 °C and decrease for higher annealing temperatures, showing a direct correlation with the atomic density of the films. Since the thickness variation is negligible, the mass loss upon thermal treatment results in amorphous structures with a lower degree of cross-linking, explaining the deterioration of the mechanical properties of the a-C:F films. |
publishDate |
2004 |
dc.date.issued.fl_str_mv |
2004 |
dc.date.accessioned.fl_str_mv |
2020-01-23T04:04:36Z |
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Estrangeiro info:eu-repo/semantics/article |
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http://hdl.handle.net/10183/204817 |
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0734-2101 |
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000503690 |
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http://hdl.handle.net/10183/204817 |
dc.language.iso.fl_str_mv |
eng |
language |
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dc.relation.ispartof.pt_BR.fl_str_mv |
Journal of Vacuum Science & Technology a : Vacuum, Surfaces and Films. New York. Vol. 22, no. 6 (Nov./Dec. 2004), p. 2321-2328 |
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