Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition

Detalhes bibliográficos
Autor(a) principal: Costa, Marcelo Eduardo Huguenin Maia da
Data de Publicação: 2004
Outros Autores: Baumvol, Israel Jacob Rabin, Radtke, Claudio, Jacobsohn, Luiz Gustavo, Zamora, R. R. M., Freire Junior, Fernando Lazaro
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/204817
Resumo: Hard amorphous fluorinated carbon films (a-C:F) deposited by plasma enhanced chemical vapor deposition were annealed in vacuum for 30 min in the temperature range of 200–600 °C. The structural and compositional modifications were followed by several analytical techniques: Rutherford backscattering spectrometry (RBS), elastic recoil detection analysis (ERDA), x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Nanoidentation measurements and lateral force microscopy experiments were carried out in order to provide the film hardness and the friction coefficient, respectively. The internal stress and contact angle were also measured. RBS, ERDA, and XPS results indicate that both fluorine and hydrogen losses occur for annealing temperatures higher than 300 °C. Raman spectroscopy shows a progressive graphitization upon annealing, while the surface became slightly more hydrophobic as revealed by the increase of the contact angle. Following the surface wettability reduction, a decrease of the friction coefficient was observed. These results highlight the influence of the capillary condensation on the nanoscale friction. The film hardness and the internal stress are constant up to 300 °C and decrease for higher annealing temperatures, showing a direct correlation with the atomic density of the films. Since the thickness variation is negligible, the mass loss upon thermal treatment results in amorphous structures with a lower degree of cross-linking, explaining the deterioration of the mechanical properties of the a-C:F films.
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spelling Costa, Marcelo Eduardo Huguenin Maia daBaumvol, Israel Jacob RabinRadtke, ClaudioJacobsohn, Luiz GustavoZamora, R. R. M.Freire Junior, Fernando Lazaro2020-01-23T04:04:36Z20040734-2101http://hdl.handle.net/10183/204817000503690Hard amorphous fluorinated carbon films (a-C:F) deposited by plasma enhanced chemical vapor deposition were annealed in vacuum for 30 min in the temperature range of 200–600 °C. The structural and compositional modifications were followed by several analytical techniques: Rutherford backscattering spectrometry (RBS), elastic recoil detection analysis (ERDA), x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Nanoidentation measurements and lateral force microscopy experiments were carried out in order to provide the film hardness and the friction coefficient, respectively. The internal stress and contact angle were also measured. RBS, ERDA, and XPS results indicate that both fluorine and hydrogen losses occur for annealing temperatures higher than 300 °C. Raman spectroscopy shows a progressive graphitization upon annealing, while the surface became slightly more hydrophobic as revealed by the increase of the contact angle. Following the surface wettability reduction, a decrease of the friction coefficient was observed. These results highlight the influence of the capillary condensation on the nanoscale friction. The film hardness and the internal stress are constant up to 300 °C and decrease for higher annealing temperatures, showing a direct correlation with the atomic density of the films. Since the thickness variation is negligible, the mass loss upon thermal treatment results in amorphous structures with a lower degree of cross-linking, explaining the deterioration of the mechanical properties of the a-C:F films.application/pdfengJournal of Vacuum Science & Technology a : Vacuum, Surfaces and Films. New York. Vol. 22, no. 6 (Nov./Dec. 2004), p. 2321-2328Estado amorfoRecozimentoCarbonoPlasma CVDEspectroscopia RamanRetroespalhamento rutherfordFilmes finosEspectro de fotoeletrons produzidos por raios-xEffects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor depositionEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSTEXT000503690.pdf.txt000503690.pdf.txtExtracted Texttext/plain33664http://www.lume.ufrgs.br/bitstream/10183/204817/2/000503690.pdf.txt1f2fce5c6c8dbdeeb389a89a6e0cd8d3MD52ORIGINAL000503690.pdfTexto completo (inglês)application/pdf388894http://www.lume.ufrgs.br/bitstream/10183/204817/1/000503690.pdfc50f7e6cc916a84a458092c7621245a1MD5110183/2048172022-04-20 04:46:13.492322oai:www.lume.ufrgs.br:10183/204817Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2022-04-20T07:46:13Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
title Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
spellingShingle Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
Costa, Marcelo Eduardo Huguenin Maia da
Estado amorfo
Recozimento
Carbono
Plasma CVD
Espectroscopia Raman
Retroespalhamento rutherford
Filmes finos
Espectro de fotoeletrons produzidos por raios-x
title_short Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
title_full Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
title_fullStr Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
title_full_unstemmed Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
title_sort Effects of thermal annealing on the structural, mechanical, and tribological properties of hard fluorinated carbon films deposited by plasma enhanced chemical vapor deposition
author Costa, Marcelo Eduardo Huguenin Maia da
author_facet Costa, Marcelo Eduardo Huguenin Maia da
Baumvol, Israel Jacob Rabin
Radtke, Claudio
Jacobsohn, Luiz Gustavo
Zamora, R. R. M.
Freire Junior, Fernando Lazaro
author_role author
author2 Baumvol, Israel Jacob Rabin
Radtke, Claudio
Jacobsohn, Luiz Gustavo
Zamora, R. R. M.
Freire Junior, Fernando Lazaro
author2_role author
author
author
author
author
dc.contributor.author.fl_str_mv Costa, Marcelo Eduardo Huguenin Maia da
Baumvol, Israel Jacob Rabin
Radtke, Claudio
Jacobsohn, Luiz Gustavo
Zamora, R. R. M.
Freire Junior, Fernando Lazaro
dc.subject.por.fl_str_mv Estado amorfo
Recozimento
Carbono
Plasma CVD
Espectroscopia Raman
Retroespalhamento rutherford
Filmes finos
Espectro de fotoeletrons produzidos por raios-x
topic Estado amorfo
Recozimento
Carbono
Plasma CVD
Espectroscopia Raman
Retroespalhamento rutherford
Filmes finos
Espectro de fotoeletrons produzidos por raios-x
description Hard amorphous fluorinated carbon films (a-C:F) deposited by plasma enhanced chemical vapor deposition were annealed in vacuum for 30 min in the temperature range of 200–600 °C. The structural and compositional modifications were followed by several analytical techniques: Rutherford backscattering spectrometry (RBS), elastic recoil detection analysis (ERDA), x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Nanoidentation measurements and lateral force microscopy experiments were carried out in order to provide the film hardness and the friction coefficient, respectively. The internal stress and contact angle were also measured. RBS, ERDA, and XPS results indicate that both fluorine and hydrogen losses occur for annealing temperatures higher than 300 °C. Raman spectroscopy shows a progressive graphitization upon annealing, while the surface became slightly more hydrophobic as revealed by the increase of the contact angle. Following the surface wettability reduction, a decrease of the friction coefficient was observed. These results highlight the influence of the capillary condensation on the nanoscale friction. The film hardness and the internal stress are constant up to 300 °C and decrease for higher annealing temperatures, showing a direct correlation with the atomic density of the films. Since the thickness variation is negligible, the mass loss upon thermal treatment results in amorphous structures with a lower degree of cross-linking, explaining the deterioration of the mechanical properties of the a-C:F films.
publishDate 2004
dc.date.issued.fl_str_mv 2004
dc.date.accessioned.fl_str_mv 2020-01-23T04:04:36Z
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dc.identifier.issn.pt_BR.fl_str_mv 0734-2101
dc.identifier.nrb.pt_BR.fl_str_mv 000503690
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dc.language.iso.fl_str_mv eng
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dc.relation.ispartof.pt_BR.fl_str_mv Journal of Vacuum Science & Technology a : Vacuum, Surfaces and Films. New York. Vol. 22, no. 6 (Nov./Dec. 2004), p. 2321-2328
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dc.source.none.fl_str_mv reponame:Repositório Institucional da UFRGS
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reponame_str Repositório Institucional da UFRGS
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