On the assessment of electrically active defects in high-mobility materials and devices
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , , , , , , , , , , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1109/ICSICT.2016.7998903 http://hdl.handle.net/11449/170090 |
Resumo: | A possible strategy for the characterization of grown-in and processing-induced electrically active point and extended defects in high-mobility substrates is presented and illustrated by examples obtained on Ge as a prototype system. |
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Repositório Institucional da UNESP |
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On the assessment of electrically active defects in high-mobility materials and devicesA possible strategy for the characterization of grown-in and processing-induced electrically active point and extended defects in high-mobility substrates is presented and illustrated by examples obtained on Ge as a prototype system.Imec, Kapeldreef 75Ghent University Depart. Solid State Sciences, Krijgslaan 28 1S1University of Sao PauloDepartment of Electrical Engineering and Computer Science Vanderbilt UniversityUNESPEE Depart. KU Leuven, Kasteelpark Arenberg 10UNESPImecGhent UniversityUniversidade de São Paulo (USP)Vanderbilt UniversityUniversidade Estadual Paulista (Unesp)KU LeuvenSimoen, EddyEneman, GeertDe Oliveira, Alberto ViniciusNi, KaiMitard, JeromeWitters, LiesbethDer Agopian, Paula Ghedini [UNESP]Martino, Joao AntonioFleetwood, Daniel M.Schrimpf, Ronald D.Reed, Robert A.Collaert, NadineThean, AaronClaeys, Cor2018-12-11T16:49:13Z2018-12-11T16:49:13Z2017-07-31info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject300-303http://dx.doi.org/10.1109/ICSICT.2016.79989032016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 300-303.http://hdl.handle.net/11449/17009010.1109/ICSICT.2016.79989032-s2.0-85028684734Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedingsinfo:eu-repo/semantics/openAccess2021-10-23T21:47:01Zoai:repositorio.unesp.br:11449/170090Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T14:38:50.327624Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
On the assessment of electrically active defects in high-mobility materials and devices |
title |
On the assessment of electrically active defects in high-mobility materials and devices |
spellingShingle |
On the assessment of electrically active defects in high-mobility materials and devices Simoen, Eddy |
title_short |
On the assessment of electrically active defects in high-mobility materials and devices |
title_full |
On the assessment of electrically active defects in high-mobility materials and devices |
title_fullStr |
On the assessment of electrically active defects in high-mobility materials and devices |
title_full_unstemmed |
On the assessment of electrically active defects in high-mobility materials and devices |
title_sort |
On the assessment of electrically active defects in high-mobility materials and devices |
author |
Simoen, Eddy |
author_facet |
Simoen, Eddy Eneman, Geert De Oliveira, Alberto Vinicius Ni, Kai Mitard, Jerome Witters, Liesbeth Der Agopian, Paula Ghedini [UNESP] Martino, Joao Antonio Fleetwood, Daniel M. Schrimpf, Ronald D. Reed, Robert A. Collaert, Nadine Thean, Aaron Claeys, Cor |
author_role |
author |
author2 |
Eneman, Geert De Oliveira, Alberto Vinicius Ni, Kai Mitard, Jerome Witters, Liesbeth Der Agopian, Paula Ghedini [UNESP] Martino, Joao Antonio Fleetwood, Daniel M. Schrimpf, Ronald D. Reed, Robert A. Collaert, Nadine Thean, Aaron Claeys, Cor |
author2_role |
author author author author author author author author author author author author author |
dc.contributor.none.fl_str_mv |
Imec Ghent University Universidade de São Paulo (USP) Vanderbilt University Universidade Estadual Paulista (Unesp) KU Leuven |
dc.contributor.author.fl_str_mv |
Simoen, Eddy Eneman, Geert De Oliveira, Alberto Vinicius Ni, Kai Mitard, Jerome Witters, Liesbeth Der Agopian, Paula Ghedini [UNESP] Martino, Joao Antonio Fleetwood, Daniel M. Schrimpf, Ronald D. Reed, Robert A. Collaert, Nadine Thean, Aaron Claeys, Cor |
description |
A possible strategy for the characterization of grown-in and processing-induced electrically active point and extended defects in high-mobility substrates is presented and illustrated by examples obtained on Ge as a prototype system. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-07-31 2018-12-11T16:49:13Z 2018-12-11T16:49:13Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1109/ICSICT.2016.7998903 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 300-303. http://hdl.handle.net/11449/170090 10.1109/ICSICT.2016.7998903 2-s2.0-85028684734 |
url |
http://dx.doi.org/10.1109/ICSICT.2016.7998903 http://hdl.handle.net/11449/170090 |
identifier_str_mv |
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 300-303. 10.1109/ICSICT.2016.7998903 2-s2.0-85028684734 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
300-303 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808128393661644800 |